2017 International Mixed Signals Testing Workshop (IMSTW)
Latest Publications

TOTAL DOCUMENTS

16

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3

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Published By IEEE

9781538618134

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Harmonic cancelation strategies for on-chip sinusoidal signal generation using digital resources

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995201 ◽

2017 ◽

Author(s):

Hani Malloug ◽

Manuel J. Barragan ◽

Salvador Mir ◽

Herve Le Gall

Keyword(s):

Sinusoidal Signal ◽

Signal Generation ◽

Digital Resources ◽

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Verification and test of real circuits

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995208 ◽

2017 ◽

Author(s):

Mohamed Denguir ◽

Sebastian M. Sattler

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Design of efficient analog physically unclonable functions using alternative test principles

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995207 ◽

2017 ◽

Author(s):

Sabyasachi Deyati ◽

Barry Muldrey ◽

Adit Singh ◽

Abhijit Chatterjee

Keyword(s):

Physically Unclonable Functions ◽

Alternative Test

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Likelihood-sampling adaptive fault simulation

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995200 ◽

2017 ◽

Author(s):

Gildas Leger ◽

Antonio Gines

Keyword(s):

Fault Simulation

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Reliability analysis and mitigation of near threshold caches

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995203 ◽

2017 ◽

Author(s):

Anteneh Gebregiorgis ◽

Mehdi B. Tahoori

Keyword(s):

Reliability Analysis ◽

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Analytical study of on-chip generations of analog sine-wave based on combined digital signals

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995205 ◽

2017 ◽

Author(s):

Stephane David-Grignot ◽

Achraf Lamlih ◽

Vincent Kerzerho ◽

Florence Azaıs ◽

Fabien Soulier ◽

...

Keyword(s):

Analytical Study ◽

Sine Wave ◽

Digital Signals ◽

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A dimensionality-reduction method for test data

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995209 ◽

2017 ◽

Author(s):

Mohamed Denguir ◽

Sebastian M. Sattler

Keyword(s):

Dimensionality Reduction ◽

Test Data ◽

Reduction Method ◽

Dimensionality Reduction Method

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Reliability of 3D-printed dynamic scanners

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995204 ◽

2017 ◽

Author(s):

Burak Mert Gönültaş ◽

Sacid Aygün ◽

Ramin Khayatzadeh ◽

Fehmi Çivitci ◽

Yiğit Dağhan Gökdel ◽

...

Keyword(s):

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[Front cover]

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995195 ◽

2017 ◽

Keyword(s):

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Analog circuit testing

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995206 ◽

2017 ◽

Author(s):

Alkis A. Hatzopoulos

Keyword(s):

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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