analog circuit testing Latest Research Papers

A Versatile Test Set Generation Tool for Structural Analog Circuit Testing

10.1109/sbcci53441.2021.9529987 ◽

2021 ◽

Author(s):

Lucas B. Zilch ◽

Marcelo S. Lubaszewski ◽

Tiago R. Balen

Keyword(s):

Analog Circuit ◽

Structural Analog ◽

Circuit Testing ◽

Test Set ◽

Analog Circuit Testing

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Analog circuit testing

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995206 ◽

2017 ◽

Author(s):

Alkis A. Hatzopoulos

Keyword(s):

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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Look up Table Based Low Power Analog Circuit Testing

International Journal of Engineering ◽

10.5829/idosi.ije.2016.29.09c.10 ◽

2016 ◽

Vol 29 (9) ◽

Keyword(s):

Low Power ◽

Analog Circuit ◽

Circuit Testing ◽

Look Up Table ◽

Analog Circuit Testing

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Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing

Journal of Electronic Testing ◽

10.1007/s10836-012-5305-4 ◽

2012 ◽

Vol 28 (4) ◽

pp. 541-549 ◽

Cited By ~ 4

Author(s):

Suraj Sindia ◽

Vishwani D. Agrawal ◽

Virendra Singh

Keyword(s):

Analog Circuit ◽

Fault Coverage ◽

Defect Level ◽

Circuit Testing ◽

Analog Circuit Testing

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Embedded tutorial 3: Statistical learning for analog circuit testing

2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2011.5941406 ◽

2011 ◽

Author(s):

Haralampos-G. Stratigopoulos

Keyword(s):

Statistical Learning ◽

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard

IEICE Transactions on Information and Systems ◽

10.1587/transinf.e93.d.33 ◽

2010 ◽

Vol E93-D (1) ◽

pp. 33-42

Author(s):

Wimol SAN-UM ◽

Masayoshi TACHIBANA

Keyword(s):

Analog Circuit ◽

Circuit Testing ◽

Testing Scheme ◽

Analog Circuit Testing

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Analog Circuit Testing Using Auto Regressive Moving Average Models

20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) ◽

10.1109/vlsid.2007.35 ◽

2007 ◽

Author(s):

Jeffrey Ayres ◽

Michael L. Bushnell

Keyword(s):

Analog Circuit ◽

Moving Average ◽

Circuit Testing ◽

Moving Average Models ◽

Auto Regressive ◽

Analog Circuit Testing

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An integrated approach for analog circuit testing using autocorrelation analysis, singular value decomposition and probabilistic neural network

Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442) ◽

10.1109/icm.2003.238302 ◽

2003 ◽

Cited By ~ 4

Author(s):

M.F. Abu El-Yazeed

Keyword(s):

Neural Network ◽

Singular Value Decomposition ◽

Analog Circuit ◽

Probabilistic Neural Network ◽

Integrated Approach ◽

Singular Value ◽

Autocorrelation Analysis ◽

Circuit Testing ◽

Value Decomposition ◽

Analog Circuit Testing

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On the application of fault detection observers to analog circuit testing

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246525 ◽

2002 ◽

Cited By ~ 1

Author(s):

W. Vermeiren ◽

B. Straube ◽

C. Hohn

Keyword(s):

Fault Detection ◽

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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Analog circuit testing based on sensitivity computation and new circuit modeling

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470638 ◽

2002 ◽

Cited By ~ 47

Author(s):

N.B. Hamida ◽

B. Kaminska

Keyword(s):

Analog Circuit ◽

Circuit Modeling ◽

Circuit Testing ◽

Analog Circuit Testing

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analog circuit testing
Recently Published Documents

TOTAL DOCUMENTS

H-INDEX

A Versatile Test Set Generation Tool for Structural Analog Circuit Testing

Analog circuit testing

Look up Table Based Low Power Analog Circuit Testing

Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing

Embedded tutorial 3: Statistical learning for analog circuit testing

A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard

Analog Circuit Testing Using Auto Regressive Moving Average Models

An integrated approach for analog circuit testing using autocorrelation analysis, singular value decomposition and probabilistic neural network

On the application of fault detection observers to analog circuit testing

Analog circuit testing based on sensitivity computation and new circuit modeling

Export Citation Format

analog circuit testingRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

A Versatile Test Set Generation Tool for Structural Analog Circuit Testing

Analog circuit testing

Look up Table Based Low Power Analog Circuit Testing

Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing

Embedded tutorial 3: Statistical learning for analog circuit testing

A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard

Analog Circuit Testing Using Auto Regressive Moving Average Models

An integrated approach for analog circuit testing using autocorrelation analysis, singular value decomposition and probabilistic neural network

On the application of fault detection observers to analog circuit testing

Analog circuit testing based on sensitivity computation and new circuit modeling

analog circuit testing
Recently Published Documents