2006 15th Asian Test Symposium
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0769526284
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage

2006 ◽  
Author(s):  
Sying-jyan Wang ◽  
Kuo-lin Peng ◽  
Katherine Li
Keyword(s):  
Test Coverage ◽  
Scan Chain

scholarly journals An Optimum ORA BIST for Multiple Fault FPGA Look-Up Table Testing

2006 ◽  
Author(s):  
Armin Alaghi ◽  
Mahnaz Yarandi ◽  
Zainalabedin Navabi
Keyword(s):  
Multiple Fault ◽  
Look Up Table

BCH-based Compactors of Test Responses with Controllable Masks

2006 ◽  
Author(s):  
Taweesak Reungpeerakul ◽  
Xiaoshu Qian ◽  
Samiha Mourad

Design for Testability of Software-Based Self-Test for Processors

2006 ◽  
Author(s):  
Masato Nakazato ◽  
Satoshi Ohtake ◽  
Michiko Inoue ◽  
Hideo Fujiwara
Keyword(s):  
Design For Testability ◽  
Self Test

Defect Diagnosis - Reasoning Methodology

2006 ◽  
Author(s):  
Yasuo Sato ◽  
Kazushi Sugiura ◽  
Reisuke Shimoda ◽  
Yutaka Yoshizawa ◽  
Kenji Norimatsu ◽  
...  
Keyword(s):  
Defect Diagnosis

An Enhanced SRAM BISR Design with Reduced Timing Penalty

2006 ◽  
Author(s):  
Li-ming Denq ◽  
Tzu-chiang Wang ◽  
Cheng-wen Wu
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