Proceedings International Test Conference 1997
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138

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25

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Published By Int. Test Conference

0780342097

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Advances in Probe Technology: Best Sessions of the '97 Southwest Test Workshop

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639720 ◽

2005 ◽

Author(s):

D. Unzicker

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Using BIST control for pattern generation

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639636 ◽

2002 ◽

Cited By ~ 35

Author(s):

G. Kiefer ◽

H.-J. Wunderlich

Keyword(s):

Pattern Generation

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Memory test-debugging test vectors without ATE

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639678 ◽

2002 ◽

Author(s):

S. Westfall

Keyword(s):

Memory Test ◽

Test Vectors

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Modifying user-defined logic for test access to embedded cores

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639594 ◽

2002 ◽

Cited By ~ 25

Author(s):

B. Pouya ◽

N.A. Touba

Keyword(s):

Embedded Cores

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Supervisors for testing non-deterministically specified systems

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639710 ◽

2002 ◽

Cited By ~ 1

Author(s):

T. Savor ◽

R.E. Seviora

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HABIST: histogram-based analog built in self test

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639689 ◽

2002 ◽

Cited By ~ 25

Author(s):

A. Frisch ◽

T. Almy

Keyword(s):

Self Test ◽

Built In Self Test

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Parasitic effect removal for analog measurement in P1149.4 environment

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639656 ◽

2002 ◽

Cited By ~ 3

Author(s):

Chauchin Su ◽

Yue-Tsang Chen ◽

Shyh-Jye Jou

Keyword(s):

Parasitic Effect

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"Ethics, professionalism and accountability in testing"

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639724 ◽

2002 ◽

Author(s):

W.R. Simpson

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Design and realization of an accurate built-in current sensor for on-line power dissipation measurement and I/sub DDQ/ testing

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639666 ◽

2002 ◽

Cited By ~ 9

Author(s):

K. Arabi ◽

B. Kaminska

Keyword(s):

Power Dissipation ◽

Current Sensor ◽

On Line

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ACT: a DFT tool for self-timed circuits

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639697 ◽

2002 ◽

Author(s):

A. Khoche ◽

E. Brunvand

Keyword(s):

Timed Circuits

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