25th IEEE VLSI Test Symmposium (VTS'07)
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0769528120
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester

2007 ◽  
Author(s):  
Matthieu Tuna ◽  
Mounir Benabdenbi ◽  
Alain Greiner
Keyword(s):  
System On Chip ◽  
On Chip

Accelerating Diagnosis via Dominance Relations between Sets of Faults

2007 ◽  
Author(s):  
Rajsekhar Adapa ◽  
Spyros Tragoudas ◽  
Maria K Michael
Keyword(s):  
Dominance Relations

Power Virus Generation Using Behavioral Models of Circuits

2007 ◽  
Author(s):  
K. Najeeb ◽  
Vishnu Vardhan Reddy Konda ◽  
Siva Kumar Sastry Hari ◽  
V. Kamakoti ◽  
Vivekananda M Vedula
Keyword(s):  
Behavioral Models

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages

2007 ◽  
Author(s):  
D. Arumi ◽  
R. Rodriguez-Montanes ◽  
J. Figueras ◽  
S. Eichenberger ◽  
C. Hora ◽  
...  
Keyword(s):  
Low Power ◽  
Power Supply ◽  
Supply Voltages ◽  
Current Signatures

TAM Design and Optimization for Transparency-Based SoC Test

2007 ◽  
Author(s):  
Tomokazu Yoneda ◽  
Akiko Shuto ◽  
Hideyuki Ichihara ◽  
Tomoo Inoue ◽  
Hideo Fujiwara
Keyword(s):  
Design And Optimization ◽  
Soc Test

DfT for the Reuse of Networks-on-Chip as Test Access Mechanism

2007 ◽  
Author(s):  
Alexandre M. Amory ◽  
Frederico Ferlini ◽  
Marcelo Lubaszewski ◽  
Fernando Moraes
Keyword(s):  
Networks On Chip ◽  
Test Access Mechanism ◽  
On Chip
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