The 17th Annual SEMI/IEEE ASMC 2006 Conference
Latest Publications

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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Application of Back-side Alignment of Thick Layers for the Manufacturing of Advanced Power Devices

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638732 ◽

2006 ◽

Author(s):

Jung Kil Lee ◽

R. Chisholm ◽

M. van der Heijden ◽

K. Best ◽

P. ten Berge

Keyword(s):

Back Side ◽

Power Devices ◽

Thick Layers

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Corporate Partnerships Establish an Asynchronous Learning Initiative with the University of the Philippines, College of Engineering

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638784 ◽

2006 ◽

Author(s):

M.C. Saquilayan ◽

J. Tulao ◽

M.T. Benitez ◽

T. Hall ◽

R.P. Jensen ◽

...

Keyword(s):

The Philippines ◽

Asynchronous Learning ◽

College Of Engineering ◽

The University ◽

Corporate Partnerships

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Semi-quantitative Analysis Techniques for AMC Monitoring

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638788 ◽

2006 ◽

Cited By ~ 1

Author(s):

Mei Leng Kwan ◽

C. Muller ◽

See Boon Tan ◽

R. Thomas

Keyword(s):

Quantitative Analysis ◽

Analysis Techniques

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A Best Known Method for Forming a Multi-Fab Cost Reduction Infrastructure and Applying Innovative Cost Reduction Techniques in Diffusion.

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638791 ◽

2006 ◽

Author(s):

H. Hershkovitz ◽

M. Batra

Keyword(s):

Cost Reduction ◽

Reduction Techniques

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Novel Sustainable and Structured Model, System and Methodology for Engineering Competency Development

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638785 ◽

2006 ◽

Cited By ~ 2

Author(s):

Ronnie Choo Hean Ng ◽

Sook Chien Chan ◽

Victor Kam Kien Wong

Keyword(s):

Model System ◽

Competency Development ◽

Structured Model

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Methods for Fast Yield Learning in A DRAM Wafer Fab using a Remote Packaging and Test Site.

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638748 ◽

2006 ◽

Author(s):

R. Trahan ◽

W. Hill ◽

R. Chapman ◽

A. Bicho ◽

N. Gumaer ◽

...

Keyword(s):

Test Site ◽

Wafer Fab ◽

Yield Learning

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Cycle Time Approximations for the G/G/m Queue Subject to Server Failures and Cycle Time Offsets with Applications

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638777 ◽

2006 ◽

Cited By ~ 5

Author(s):

J.R. Morrison ◽

D.P. Martin

Keyword(s):

Cycle Time

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Simulation Study of Robust Dispatching Algorithm for Mixed VLSl Manufacturing

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638754 ◽

2006 ◽

Author(s):

K. Saito

Keyword(s):

Simulation Study ◽

Dispatching Algorithm

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Infusion processing for advanced transistor manufacturing

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638746 ◽

2006 ◽

Author(s):

W. Skinner ◽

M. Gwinn ◽

J. Hautala ◽

T. Kuroi

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Incorporating SIMS Structures in Product Wafers in Order to Perform SIMS and other Material Analysis and Achieve Wafer Level Information about the Front-End Processing

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638717 ◽

2006 ◽

Author(s):

T. Budri ◽

L. Krott ◽

N. Patel ◽

A. Smith ◽

B. Gurcan ◽

...

Keyword(s):

Wafer Level ◽

Material Analysis ◽

Front End ◽

Level Information

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The 17th Annual SEMI/IEEE ASMC 2006 ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Application of Back-side Alignment of Thick Layers for the Manufacturing of Advanced Power Devices

Corporate Partnerships Establish an Asynchronous Learning Initiative with the University of the Philippines, College of Engineering

Semi-quantitative Analysis Techniques for AMC Monitoring

A Best Known Method for Forming a Multi-Fab Cost Reduction Infrastructure and Applying Innovative Cost Reduction Techniques in Diffusion.

Novel Sustainable and Structured Model, System and Methodology for Engineering Competency Development

Methods for Fast Yield Learning in A DRAM Wafer Fab using a Remote Packaging and Test Site.

Cycle Time Approximations for the G/G/m Queue Subject to Server Failures and Cycle Time Offsets with Applications

Simulation Study of Robust Dispatching Algorithm for Mixed VLSl Manufacturing

Infusion processing for advanced transistor manufacturing

Incorporating SIMS Structures in Product Wafers in Order to Perform SIMS and other Material Analysis and Achieve Wafer Level Information about the Front-End Processing

The 17th Annual SEMI/IEEE ASMC 2006 Conference
Latest Publications