Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93
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State encoding and functional decomposition for self-checking sequential circuit design

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398820 ◽

2002 ◽

Author(s):

S. Pagey ◽

S.D. Sherlekar ◽

G. Venkatesh

Keyword(s):

Circuit Design ◽

Sequential Circuit ◽

Functional Decomposition ◽

State Encoding

A new method for system diagnosis

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398794 ◽

2002 ◽

Author(s):

S. Xu ◽

J. Gao

Keyword(s):

New Method ◽

System Diagnosis

Subjective fault evaluation method of electronic circuits

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398786 ◽

2002 ◽

Author(s):

M. Hashizume ◽

Y. Iwata ◽

T. Tamesada

Keyword(s):

Evaluation Method ◽

Electronic Circuits

General design principles of self-testing code-disjoint PLAs

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398819 ◽

2002 ◽

Cited By ~ 6

Author(s):

S.J. Piestrak

Keyword(s):

Design Principles ◽

General Design ◽

Self Testing

LFSROM: A hardware test pattern generator for deterministic ISCAS85 test sets

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398796 ◽

2002 ◽

Cited By ~ 7

Author(s):

C. Dufaza ◽

C. Chevalier ◽

L.F.C. Lew Yan Voon

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Test Sets ◽

Hardware Test

A two-phase fault simulation scheme for sequential circuits

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398780 ◽

2002 ◽

Author(s):

W.C. Wu ◽

C.L. Lee ◽

J.E. Chen

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

Two Phase ◽

Simulation Scheme

Universal test set generation for CMOS circuits

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398765 ◽

2002 ◽

Author(s):

B. Chen ◽

C.L. Lee

Keyword(s):

Cmos Circuits ◽

Test Set ◽

Universal Test

Fault modelisation of external shorts in CMOS circuits

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398811 ◽

2002 ◽

Author(s):

M. Renovell ◽

P. Huc ◽

Y. Bertrand

Keyword(s):

Cmos Circuits

MISSED: An environment for mixed-signal microsystem testing and diagnosis

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398785 ◽

2002 ◽

Author(s):

H.G. Kerkhoff ◽

G. Docherty

Keyword(s):

Mixed Signal

Effectiveness of stuck-at test sets to detect bridging faults in Iddq environment

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398813 ◽

2002 ◽

Cited By ~ 3

Author(s):

S. Hwang ◽

R. Rajsuman

Keyword(s):

Bridging Faults ◽

Test Sets

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

State encoding and functional decomposition for self-checking sequential circuit design

A new method for system diagnosis

Subjective fault evaluation method of electronic circuits

General design principles of self-testing code-disjoint PLAs

LFSROM: A hardware test pattern generator for deterministic ISCAS85 test sets

A two-phase fault simulation scheme for sequential circuits

Universal test set generation for CMOS circuits

Fault modelisation of external shorts in CMOS circuits

MISSED: An environment for mixed-signal microsystem testing and diagnosis

Effectiveness of stuck-at test sets to detect bridging faults in Iddq environment

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93
Latest Publications