2015 73rd Annual Device Research Conference (DRC)
Latest Publications

TOTAL DOCUMENTS

172

(FIVE YEARS 0)

H-INDEX

7

(FIVE YEARS 0)

Published By IEEE

9781467381345, 9781467381352

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Anomalous process temperature scaling behavior of sol-gel ZrOx gate dielectrics: Mobility enhancement in ZnO TFTs

2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175634 ◽

2015 ◽

Author(s):

Andre Zeumault ◽

Vivek Subramanian

Keyword(s):

Gate Dielectrics ◽

Sol Gel ◽

Scaling Behavior ◽

Process Temperature ◽

Temperature Scaling

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Proposal of 0.13um new structure LDMOS for automotive PMIC

2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175584 ◽

2015 ◽

Author(s):

Kwangsik Ko ◽

Joowon Park ◽

Jina Eum ◽

Kuemju Lee ◽

Sanghyun Lee ◽

...

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InAlN/GaN MOSHEMTs with high drain current of 2.3 A/mm high on/off ratio of 1012 and low SS of 64 mV/dec enabled by atomic-layer-epitaxial MgCaO as gate dielectric

2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175552 ◽

2015 ◽

Author(s):

Hong Zhou ◽

Xiabing Lou ◽

Heng Wu ◽

Sami Alghamdi ◽

Shiping Guo ◽

...

Keyword(s):

Gate Dielectric ◽

Drain Current ◽

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Out-of-plane strain effect on silicon-based flexible FinFETs

2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175572 ◽

2015 ◽

Author(s):

Mohamed T. Ghoneim ◽

Nasir Alfaraj ◽

Galo A. Torres Sevilla ◽

Hossain M. Fahad ◽

Muhammad M. Hussain

Keyword(s):

Plane Strain ◽

Strain Effect ◽

Out Of Plane ◽

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2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175541 ◽

2015 ◽

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The path to fabricating carbon nanotube array field effect transistors with uniform wafer scale performance suitable for advanced RF applications

2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175679 ◽

2015 ◽

Author(s):

M.E. Grubbs ◽

A.E. Berghmans ◽

M.J. Walker ◽

M.P. Lilly ◽

J.X. Przybysz

Keyword(s):

Carbon Nanotube ◽

Field Effect ◽

Field Effect Transistors ◽

Nanotube Array ◽

Wafer Scale ◽

Carbon Nanotube Array ◽

Rf Applications

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Exhibitor profiles

2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175524 ◽

2015 ◽

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Analysis of coupling strength in multi-domain magneto-systems

2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175580 ◽

2015 ◽

Author(s):

Nickvash Kani ◽

Sourav Dutta ◽

Azad Naeemi

Keyword(s):

Coupling Strength

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2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175645 ◽

2015 ◽

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[Front matter]

2015 73rd Annual Device Research Conference (DRC) ◽

10.1109/drc.2015.7175522 ◽

2015 ◽

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