2013 IEEE International Test Conference (ITC)
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TOTAL DOCUMENTS

73
(FIVE YEARS 0)

H-INDEX

13
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Published By IEEE

9781479908592
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Adaptive testing - Cost reduction through test pattern sampling

2013 ◽  
Author(s):  
Matt Grady ◽  
Bradley Pepper ◽  
Joshua Patch ◽  
Michael Degregorio ◽  
Phil Nigh
Keyword(s):  
Cost Reduction ◽  
Test Pattern ◽  
Adaptive Testing ◽  
Testing Cost

A novel test structure for measuring the threshold voltage variance in MOSFETs

2013 ◽  
Author(s):  
Takahiro J. Yamaguchi ◽  
James S. Tandon ◽  
Satoshi Komatsu ◽  
Kunihiro Asada
Keyword(s):  
Threshold Voltage ◽  
Test Structure

Test data analytics — Exploring spatial and test-item correlations in production test data

2013 ◽  
Author(s):  
Chun-Kai Hsu ◽  
Fan Lin ◽  
Kwang-Ting Cheng ◽  
Wangyang Zhang ◽  
Xin Li ◽  
...  
Keyword(s):  
Test Data ◽  
Test Item ◽  
Data Analytics ◽  
Production Test

Diagnosis and Layout Aware (DLA) scan chain stitching

2013 ◽  
Author(s):  
Jing Ye ◽  
Yu Huang ◽  
Yu Hu ◽  
Wu-Tung Cheng ◽  
Ruifeng Guo ◽  
...  
Keyword(s):  
Scan Chain
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