A novel test structure for measuring the threshold voltage variance in MOSFETs

2013 ◽  
Author(s):  
Takahiro J. Yamaguchi ◽  
James S. Tandon ◽  
Satoshi Komatsu ◽  
Kunihiro Asada
Keyword(s):  
Threshold Voltage ◽  
Test Structure

Operational Amplifier Based Test Structure for Quantifying Transistor Threshold Voltage Variation

2009 ◽  
Vol 22 (1) ◽  
pp. 51-58 ◽  
Author(s):  
Brian L. Ji ◽  
Dale J. Pearson ◽  
Isaac Lauer ◽  
Franco Stellari ◽  
David J. Frank ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Operational Amplifier ◽  
Test Structure ◽  
Voltage Variation

Development of Test Structure for Variability Evaluation using Charge-Based Capacitance Measurement

2014 ◽  
Vol E97.C (11) ◽  
pp. 1117-1123 ◽  
Author(s):  
Katsuhiro TSUJI ◽  
Kazuo TERADA ◽  
Ryota KIKUCHI
Keyword(s):  
Test Structure ◽  
Capacitance Measurement

Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations

2009 ◽  
Vol E92-A (4) ◽  
pp. 990-997
Author(s):  
Takaaki OKUMURA ◽  
Atsushi KUROKAWA ◽  
Hiroo MASUDA ◽  
Toshiki KANAMOTO ◽  
Masanori HASHIMOTO ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Time Variation ◽  
Transition Time ◽  
Computational Accuracy
Sign in / Sign up

Export Citation Format

Share Document