Characterization of Microstructures by Analytical Electron Microscopy (AEM)
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Published By Springer Berlin Heidelberg

9783642201189, 9783642201196

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High Resolution and High Spatial Resolution of Analytical Electron Microscopy

Characterization of Microstructures by Analytical Electron Microscopy (AEM) ◽

10.1007/978-3-642-20119-6_6 ◽

2012 ◽

pp. 379-490

Author(s):

Yonghua Rong

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Spatial Resolution ◽

High Spatial Resolution ◽

Analytical Electron Microscopy ◽

Analytical Electron

Mathematics Analysis in Electron Diffraction and Crystallography

Characterization of Microstructures by Analytical Electron Microscopy (AEM) ◽

10.1007/978-3-642-20119-6_4 ◽

2012 ◽

pp. 171-293

Author(s):

Yonghua Rong

Keyword(s):

Electron Diffraction

Diffraction Contrast

Characterization of Microstructures by Analytical Electron Microscopy (AEM) ◽

10.1007/978-3-642-20119-6_5 ◽

2012 ◽

pp. 295-378

Author(s):

Yonghua Rong

Keyword(s):

Diffraction Contrast

Electron Diffraction

Characterization of Microstructures by Analytical Electron Microscopy (AEM) ◽

10.1007/978-3-642-20119-6_3 ◽

2012 ◽

pp. 67-170

Author(s):

Yonghua Rong

Keyword(s):

Electron Diffraction

Analytical Electron Microscope (AEM)

Characterization of Microstructures by Analytical Electron Microscopy (AEM) ◽

10.1007/978-3-642-20119-6_1 ◽

2012 ◽

pp. 1-35

Author(s):

Yonghua Rong

Keyword(s):

Electron Microscope ◽

Analytical Electron ◽

Analytical Electron Microscope

Specimen Preparation

Characterization of Microstructures by Analytical Electron Microscopy (AEM) ◽

10.1007/978-3-642-20119-6_2 ◽

2012 ◽

pp. 37-66

Author(s):

Yonghua Rong

Keyword(s):

Specimen Preparation