2017 IEEE 30th International Conference on Microelectronics (MIEL)
Latest Publications

TOTAL DOCUMENTS

78
(FIVE YEARS 0)

H-INDEX

3
(FIVE YEARS 0)

Published By IEEE

9781538625613, 9781538625637
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Joint model of dose rate radiation effects in bipolar devices

2017 ◽  
Author(s):  
V. Pershenkov ◽  
A. Bakerenkov ◽  
V. Telets ◽  
V. Belyakov ◽  
V. Shurenkov ◽  
...  
Keyword(s):  
Dose Rate ◽  
Radiation Effects ◽  
Joint Model ◽  
Bipolar Devices

SEFI cross-section evaluation by fault injection software approach and hardware detection

2017 ◽  
Author(s):  
I.O. Loskutov ◽  
P.V. Nekrasov ◽  
I.I. Shvetsov-Shilovskiy ◽  
D.V. Boychenko ◽  
V.M. Uzhegov
Keyword(s):  
Cross Section ◽  
Fault Injection ◽  
Section Evaluation

Basic trends in electronic components product range development: Radiation hardness aspects

2017 ◽  
Author(s):  
A.Y. Nikiforov ◽  
D. V. Boychenko ◽  
V.A. Telets ◽  
A.A. Smolin ◽  
V.V. Elesin ◽  
...  
Keyword(s):  
Radiation Hardness ◽  
Electronic Components ◽  
Product Range

Electrical and charge trapping properties of HfO2/Al2O3 multilayer dielectric stacks

2017 ◽  
Author(s):  
V. Davidovic ◽  
A. Paskaleva ◽  
D. Spassov ◽  
E. Guziewicz ◽  
T. Krajewski ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Multilayer Dielectric

Temperature influence on the TID effects in RadFETs

2017 ◽  
Author(s):  
V. Felitsyn ◽  
B. Podlepetsky ◽  
A. Bakerenkov ◽  
A. Rodin ◽  
Yu. Sukhoroslova
Keyword(s):  
Temperature Influence
Load More ...
Sign in / Sign up

Export Citation Format

Share Document