Testing and Diagnosis of Analog Circuits and Systems
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Published By Springer US

9781461597490, 9781461597476

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A Unified Theory on Test Generation for Analog/Digital Systems

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_10 ◽

1991 ◽

pp. 251-279

Author(s):

Lang Tong ◽

Ruey-wen Liu

Keyword(s):

Test Generation ◽

Digital Systems ◽

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An Artificial Intelligence Approach to Analog Systems Diagnosis

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_7 ◽

1991 ◽

pp. 187-215 ◽

Author(s):

Frank Pipitone ◽

Kenneth Dejong ◽

William Spears

Keyword(s):

Artificial Intelligence ◽

Analog Systems ◽

Intelligence Approach ◽

Artificial Intelligence Approach

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A Circuit Theoretic Approach to Analog Fault Diagnosis

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_1 ◽

1991 ◽

pp. 1-35 ◽

Author(s):

Ruey-Wen Liu

Keyword(s):

Fault Diagnosis ◽

Theoretic Approach ◽

Analog Fault Diagnosis

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A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_6 ◽

1991 ◽

pp. 147-186 ◽

Author(s):

Chin-Long Wey

Keyword(s):

Fault Diagnosis ◽

Analog Fault Diagnosis ◽

Self Testing ◽

Testing Algorithm

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Analog Multifrequency Fault Diagnosis with the Assumption of Limited Failures

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_5 ◽

1991 ◽

pp. 117-145 ◽

Author(s):

Ray Decarlo ◽

Lawrence Rapisarda ◽

Mark Wicks

Keyword(s):

Fault Diagnosis

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Fault Diagnosis of Nonlinear Electronic Circuits

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_4 ◽

1991 ◽

pp. 85-115 ◽

Author(s):

Qiu Huang ◽

Ruey-wen Liu

Keyword(s):

Fault Diagnosis ◽

Electronic Circuits

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Automatic Testing for Control Systems Conformance

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_8 ◽

1991 ◽

pp. 217-233

Author(s):

Denis R. Towill

Keyword(s):

Control Systems ◽

Automatic Testing

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Topological Testability Conditions for Analog Fault Diagnosis

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_3 ◽

1991 ◽

pp. 65-83 ◽

Author(s):

Chen-Shang Lin

Keyword(s):

Fault Diagnosis ◽

Analog Fault Diagnosis

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Linear Method vs. Nonlinear Method

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_2 ◽

1991 ◽

pp. 37-63 ◽

Author(s):

T. Matsumoto ◽

Y. Togawa

Keyword(s):

Linear Method ◽

Nonlinear Method

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Testing of Analog Integrated Circuits

Testing and Diagnosis of Analog Circuits and Systems ◽

10.1007/978-1-4615-9747-6_9 ◽

1991 ◽

pp. 235-250 ◽

Author(s):

V. Visvanathan

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits

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