Proceedings Sixth Asian Test Symposium (ATS'97)
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68

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Published By IEEE Comput. Soc

0818682094

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

An algorithm for all-du-path testing coverage of shared memory parallel programs

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643968 ◽

2002 ◽

Cited By ~ 1

Author(s):

C.-S.D. Yang ◽

L.L. Pollock

Keyword(s):

Shared Memory ◽

Parallel Programs ◽

Path Testing ◽

Testing Coverage

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Estimating the number of faults using simulator based on generalized stochastic Petri-net model

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643969 ◽

2002 ◽

Cited By ~ 1

Author(s):

O. Mizuno ◽

S. Kusumoto ◽

T. Kikuno ◽

Y. Takagi ◽

K. Sakamoto

Keyword(s):

Petri Net ◽

Stochastic Petri Net ◽

Generalized Stochastic Petri Net

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Supply current test for unit-to-unit variations of electrical characteristics in gates

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643985 ◽

2002 ◽

Cited By ~ 3

Author(s):

M. Hashizume ◽

T. Kuchii ◽

T. Tamesada

Keyword(s):

Electrical Characteristics ◽

Current Test ◽

Supply Current

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New capabilities of OBIRCH method for fault localization and defect detection

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643961 ◽

2002 ◽

Cited By ~ 29

Author(s):

K. Nikawa ◽

S. Inoue

Keyword(s):

Defect Detection ◽

Fault Localization

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I/sub DDT/ testing

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643986 ◽

2002 ◽

Author(s):

Yinghua Min ◽

Zhuxing Zhao ◽

Zhongcheng Li

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Computing stress tests for interconnect defects

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643950 ◽

2002 ◽

Cited By ~ 1

Author(s):

V. Dabholkar ◽

S. Chakravarty

Keyword(s):

Stress Tests

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Power supply current monitoring techniques for testing PLLs

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643984 ◽

2002 ◽

Cited By ~ 8

Author(s):

M. Dalmia ◽

A. Ivanov ◽

S. Tabatabaei

Keyword(s):

Power Supply ◽

Monitoring Techniques ◽

Supply Current ◽

Current Monitoring

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Novel optical probing system for quarter-μm VLSI circuits

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643960 ◽

2002 ◽

Author(s):

K. Ozaki ◽

H. Sekiguchi ◽

S. Wakana ◽

Y. Goto ◽

Y. Umehara ◽

...

Keyword(s):

Vlsi Circuits ◽

Optical Probing

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A perturbation based fault modeling and simulation for mixed-signal circuits

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643956 ◽

2002 ◽

Cited By ~ 6

Author(s):

N. Ben-Hamida ◽

K. Saab ◽

D. Marche ◽

B. Kaminska

Keyword(s):

Modeling And Simulation ◽

Fault Modeling ◽

Mixed Signal ◽

Mixed Signal Circuits

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A genetic algorithm for the computation of initialization sequences for synchronous sequential circuits

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643917 ◽

2002 ◽

Cited By ~ 2

Author(s):

F. Corno ◽

P. Prinetto ◽

M. Rebaudengo ◽

M.S. Reorda ◽

G. Squillero

Keyword(s):

Genetic Algorithm ◽

Sequential Circuits ◽

Synchronous Sequential Circuits

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