Supply current test for unit-to-unit variations of electrical characteristics in gates

2002 ◽  
Author(s):  
M. Hashizume ◽  
T. Kuchii ◽  
T. Tamesada
Keyword(s):  
Electrical Characteristics ◽  
Current Test ◽  
Supply Current

scholarly journals A Supply Current Test Method for Bridging Faults in CMOS Microprocessor Based Circuits

2003 ◽  
Vol 6 (7) ◽  
pp. 564-572
Author(s):  
Masaki HASHIZUME ◽  
Eiji TASAKA ◽  
Hiroyuki YOTSUYANAGI ◽  
Takeomi TAMESADA ◽  
Toshihiro KAYAHARA ◽  
...  
Keyword(s):  
Test Method ◽  
Bridging Faults ◽  
Current Test ◽  
Supply Current

Supply current test of analogue and mixed signal circuits

1996 ◽  
Vol 143 (6) ◽  
pp. 399 ◽  
Author(s):  
I.M. Bell ◽  
S.J. Spinks ◽  
J. Machado da Silva
Keyword(s):  
Mixed Signal ◽  
Current Test ◽  
Mixed Signal Circuits ◽  
Supply Current

scholarly journals Statistical Supply Current Test Method for Opens in TTL Circuits with IC Characteristics Variations

2005 ◽  
Vol 8 (3) ◽  
pp. 199-207
Author(s):  
Isao TSUKIMOTO ◽  
Masaki HASHIZUME ◽  
Hiroyuki YOTSUYANAGI ◽  
Takeomi TAMESADA
Keyword(s):  
Test Method ◽  
Current Test ◽  
Supply Current
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