Passivated Porous Silicon Membranes and Their Application to Optical Biosensing

A robust fabrication method for stable mesoporous silicon membranes using standard microfabrication techniques is presented. The porous silicon membranes were passivated through the atomic layer deposition of different metal oxides, namely aluminium oxide Al2O3, hafnium oxide HfO2 and titanium oxide TiO2. The fabricated membranes were characterized in terms of morphology, optical properties and chemical properties. Stability tests and optical probing noise level determination were also performed. Preliminary results using an Al2O3 passivated membranes for a biosensing application are also presented for selective optical detection of Bacillus Cereus bacterial lysate. The biosensor was able to detect the bacterial lysate, with an initial bacteria concentration of 106 colony forming units per mL (CFU/mL), in less than 10 min.

Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch

An X-pinch scheme of a low-current generator (45 kA, 50 ns rise time) is characterized as a potential efficient source of soft X-rays. The X-pinch target consists of wires of 5 μm in diameter—made from either tungsten (W) or gold (Au)-plated W—loaded at two angles of 55° and 98° between the crossed wires. Time-resolved soft X-ray emission measurements are performed to provide a secure correlation with the optical probing results. A reconstruction of the actual photodiode current profile procedure was adopted, capable of overcoming the limits of the slow rising and falling times due to the “slow” response of the diodes and the noise. The pure and Au-plated W deliver an average X-ray yield, which depends only on the angle of the crossed wires, and is measured to be ~50 mJ and ~70 mJ for the 98° and 55° crossed wire angles, respectively. An additional experimental setup was developed to characterize the X-pinch as a source of X-rays with energy higher than ~6 keV, via time-integrated measurements. The X-ray emission spectrum was found to have an upper limit at 13 keV for the Au-plated W configuration at 55°. The portable tabletop X-pinch proved to be ideal for use in X-ray radiography applications, such as the detection of interior defects in biological samples.

Electro-Optical Probing for Capturing Fast-to-Rise Scan Chain Failures

The paper discusses an imaging sensor exhibiting a fast-to-rise sanity check failure from a scan chain test. The DUT was prepared for backside analysis in a portable daughter-card [1] that enabled the analyst to easily shift between testing platforms such as a standard imaging tester bench and compact scan diagnosis system [2], while being inspected under the Electro-Optical Probing (EOP) machine. To find a failing flip-flop in several-thousands long chain, broken scan chain analysis was performed to narrow down the search to a few chain links was implemented. EOP methods of fault isolation were employed to verify the location of the broken scan cell in those selected flip-flops. Finally, parallel lapping was done to confirm the location of the failing flip-flop under a SEM.

Multi-pass probing for high-sensitivity tomographic interferometry

Optical probing is an indispensable tool in research and development. In fact, it has always been the most natural way for humankind to explore nature. However, objects consisting of transparent materials with a refractive index close to unity, such as low-density gas jets, are a typical example of samples that often reach the sensitivity limits of optical probing techniques. We introduce an advanced optical probing method employing multiple passes of the probe through the object to increase phase sensitivity, and relay-imaging of the object between individual passes to preserve spatial resolution. An interferometer with four-passes was set up and the concept was validated by tomographic characterization of low-density supersonic gas jets. The results show an evident increase of sensitivity, which allows for the accurate quantitation of fine features such as a shock formed by an obstacle or a barrel shock on the jet boundary in low ambient gas pressures. Despite its limitations in temporal resolution, this novel method has demonstrated an increase in phase sensitivity in transmission, however, it can also be employed to boost the absorption or polarization contrast of weakly interacting objects in both transmission and reflection setups, thus, upgrading the sensitivity of various optical characterization methods.

CONCEALING-Gate: Optical Contactless Probing Resilient Design

Optical probing, though developed as silicon debugging tools from the chip backside, has shown its capability of extracting secret data, such as cryptographic keys and user identifications, from modern system-on-chip devices. Existing optical probing countermeasures are based on detecting any device modification attempt or abrupt change in operating conditions during asset extraction. These countermeasures usually require additional fabrication steps and cause area and power overheads. In this article, we propose a novel low-overhead design methodology to prevent optical probing. It leverages additional operational logic gates, termed as “CONCEALING-Gates,” inserted as neighbor gates of the logic gates connected to the nets carrying asset signals. The switching activity of the asset carrying logic is camouflaged with the switching activity of the concealing-gate. The input signal and placement in the layout of the concealing-gates must be selected in such a way that they remain equally effective in preventing different variants of optical probing, i.e., electro-optical frequency mapping and Electro-optical probing. The methodology is suitable for the existing ASIC/FPGA design flow and fabrication process, since designing new standard logic cells is not required. We have performed a comprehensive security evaluation of the concealing-gates using a security metric developed based on the parameters that are crucial for optical probing. The attack resiliency of the logic cells, protected by concealing-gates, is evaluated using an empirical study-based simulation methodology and experimental validation. Our analysis has shown that in the presence of concealing-gates, logic cells achieve high resiliency against optical contactless probing techniques.