IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler
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Published By Springer International Publishing

9783030532727, 9783030532734

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Reliability Enhanced Digital Low-Dropout Regulator with Improved Transient Performance

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_9 ◽

2020 ◽

pp. 187-208

Author(s):

Longfei Wang ◽

Soner Seçkiner ◽

Selçuk Köse

Keyword(s):

Transient Performance ◽

Low Dropout Regulator

On Test Generation for Microprocessors for Extended Class of Functional Faults

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_2 ◽

2020 ◽

pp. 21-44

Author(s):

Adeboye Stephen Oyeniran ◽

Raimund Ubar ◽

Maksim Jenihhin ◽

Jaan Raik

Keyword(s):

Test Generation ◽

Functional Faults ◽

Extended Class

A Predictive Process Design Kit for Three-Independent-Gate Field-Effect Transistors

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_14 ◽

2020 ◽

pp. 307-322

Author(s):

Patsy Cadareanu ◽

Ganesh Gore ◽

Edouard Giacomin ◽

Pierre-Emmanuel Gaillardon

Keyword(s):

Process Design ◽

Field Effect ◽

Field Effect Transistors ◽

Predictive Process ◽

Independent Gate

Semi- and Fully-Random Access LUTs for Smooth Functions

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_13 ◽

2020 ◽

pp. 279-306

Author(s):

Y. Serhan Gener ◽

Furkan Aydin ◽

Sezer Gören ◽

H. Fatih Ugurdag

Keyword(s):

Random Access ◽

Smooth Functions

Software-Based Self-Test for Delay Faults

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_1 ◽

2020 ◽

pp. 1-19

Author(s):

Michelangelo Grosso ◽

Matteo Sonza Reorda ◽

Salvatore Rinaudo

Keyword(s):

Delay Faults ◽

Self Test

Robust FinFET Schmitt Trigger Designs for Low Power Applications

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_3 ◽

2020 ◽

pp. 45-68

Author(s):

Leonardo B. Moraes ◽

Alexandra Lackmann Zimpeck ◽

Cristina Meinhardt ◽

Ricardo Reis

Keyword(s):

Low Power ◽

Schmitt Trigger

Hardware-Enabled Secure Firmware Updates in Embedded Systems

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_8 ◽

2020 ◽

pp. 165-185

Author(s):

Solon Falas ◽

Charalambos Konstantinou ◽

Maria K. Michael

Keyword(s):

Embedded Systems

Security Aspects of Real-Time MPSoCs: The Flaws and Opportunities of Preemptive NoCs

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_10 ◽

2020 ◽

pp. 209-233

Author(s):

Bruno Forlin ◽

Cezar Reinbrecht ◽

Johanna Sepúlveda

Keyword(s):

Real Time

Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_6 ◽

2020 ◽

pp. 115-137

Author(s):

Vitor Bandeira ◽

Felipe Rosa ◽

Ricardo Reis ◽

Luciano Ost

Keyword(s):

Fault Injection ◽

Vulnerability Analysis ◽

Soft Error ◽

Injection Techniques

A Statistical Wafer Scale Error and Redundancy Analysis Simulator

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_7 ◽

2020 ◽

pp. 139-163

Author(s):

Atishay ◽

Ankit Gupta ◽

Rashmi Sonawat ◽

Helik Kanti Thacker ◽

B. Prasanth

Keyword(s):

Redundancy Analysis ◽

Wafer Scale ◽

Scale Error

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology EnablerLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer International Publishing

Reliability Enhanced Digital Low-Dropout Regulator with Improved Transient Performance

On Test Generation for Microprocessors for Extended Class of Functional Faults

A Predictive Process Design Kit for Three-Independent-Gate Field-Effect Transistors

Semi- and Fully-Random Access LUTs for Smooth Functions

Software-Based Self-Test for Delay Faults

Robust FinFET Schmitt Trigger Designs for Low Power Applications

Hardware-Enabled Secure Firmware Updates in Embedded Systems

Security Aspects of Real-Time MPSoCs: The Flaws and Opportunities of Preemptive NoCs

Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques

A Statistical Wafer Scale Error and Redundancy Analysis Simulator

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler
Latest Publications