IEEE European Test Workshop, 2001.
Latest Publications

TOTAL DOCUMENTS

20

(FIVE YEARS 0)

H-INDEX

4

(FIVE YEARS 0)

Published By IEEE

0769510175

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

System level diagnosis - a comparison of two alternative approaches

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946670 ◽

2005 ◽

Author(s):

M. Khalil ◽

C. Robach

Keyword(s):

System Level ◽

Alternative Approaches

Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946658 ◽

2005 ◽

Cited By ~ 1

Author(s):

H.J. VerMaak ◽

H.G. Kerkhoff

Demodulation based testing of off-chip driver performance

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946660 ◽

2005 ◽

Cited By ~ 1

Author(s):

W. Daehn

Keyword(s):

Driver Performance

Internal feedback bridging faults in combinational CMOS circuits: analysis and testing

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946655 ◽

2005 ◽

Cited By ~ 1

Author(s):

Y. Nliura ◽

S. Seno

Keyword(s):

Cmos Circuits ◽

Bridging Faults ◽

Internal Feedback

On hardware generation of random single input change test sequences

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946674 ◽

2005 ◽

Cited By ~ 9

Author(s):

R. David ◽

P. Girard ◽

C. Landrault ◽

S. Pravossoudovitch ◽

A. Virazel

Keyword(s):

Single Input

System-level DfT for consumer products

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946656 ◽

2005 ◽

Author(s):

D.C.L. van Geest ◽

F.G.M. de Jong

Keyword(s):

Consumer Products ◽

System Level

The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946666 ◽

2005 ◽

Cited By ~ 2

Author(s):

M. Worsman ◽

M.W.T. Wong ◽

Y.S. Lee

Keyword(s):

Fault Diagnosis ◽

Fault Analysis

On-chip signal level evaluation for mixed-signal ICs using digital window comparators

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946664 ◽

2005 ◽

Cited By ~ 4

Author(s):

D. De Venuto ◽

M.J. Ohletzo ◽

B. Ricco

Keyword(s):

Mixed Signal ◽

Signal Level Evaluation ◽

On Chip ◽

Chip Signal

RTL design validation, DFT and test pattern generation for high defects coverage

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946672 ◽

2005 ◽

Author(s):

M.B. Santos ◽

F.M. Gonqalves ◽

I.C. Teixeira ◽

J.P. Teixeira

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Design Validation ◽

Rtl Design

Analyzing bridging faults impact on EEPROM cell array

IEEE European Test Workshop, 2001. ◽

10.1109/etw.2001.946653 ◽

2005 ◽

Cited By ~ 2

Author(s):

J.M. Portal ◽

A. Perez

Keyword(s):

Bridging Faults ◽

Cell Array