Spin‐Polarized Electrons Impact on Terahertz Emission by High‐Order Shift Current in CsPbBr 3

2021 ◽  
pp. 2100822
Author(s):  
Yuhang He ◽  
Rui Su ◽  
Yuanyuan Huang ◽  
Qiyi Zhao ◽  
Yixuan Zhou ◽  
...  
2009 ◽  
Vol 105 (11) ◽  
pp. 113116 ◽  
Author(s):  
James M. Schleicher ◽  
Shayne M. Harrel ◽  
Charles A. Schmuttenmaer

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-9-C8-16 ◽  
Author(s):  
H. C. Siegmann ◽  
D. Mauri ◽  
D. Scholl ◽  
E. Kay

1975 ◽  
Vol 34 (11) ◽  
pp. 710-710 ◽  
Author(s):  
U. Heinzmann ◽  
H. Heuer ◽  
J. Kessler

2005 ◽  
Vol 72 (23) ◽  
Author(s):  
J. Carlos Egues ◽  
Guido Burkard ◽  
D. S. Saraga ◽  
John Schliemann ◽  
Daniel Loss

1990 ◽  
Vol 80 (1) ◽  
pp. 5-6 ◽  
Author(s):  
R. Wiesendanger ◽  
H. J. G�ntherodt ◽  
G. G�ntherodt ◽  
R. J. Gambino ◽  
R. Ruf

1993 ◽  
Vol 313 ◽  
Author(s):  
N. J. Zheng ◽  
C. Rau

ABSTRACTWe have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMPA). In SIMPA, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic Materials. By Measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMPA studies on single-crystalline Fe samples.


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