scholarly journals Droplet Entrainment Analysis in a Flash Evaporator with an Image‐Based Measurement Technique

2021 ◽  
Author(s):  
Katharina Jasch ◽  
Jonas Schulz ◽  
Hans‐Jörg Bart ◽  
Stephan Scholl
Keyword(s):  
Measurement Technique ◽  
Droplet Entrainment

New Generation Wind Measurement Technique for Disaster Prevention

2013 ◽  
Vol 133 (3) ◽  
pp. 138-140 ◽  
Author(s):  
Motoaki YASUI ◽  
Shoken ISHII ◽  
Hironori IWAI
Keyword(s):  
Measurement Technique ◽  
Disaster Prevention ◽  
Wind Measurement ◽  
New Generation

Permittivity Measurement Technique for Inhomogeneous Dielectric Materials

2006 ◽  
Vol 65 (15) ◽  
pp. 1439-1451
Author(s):  
V. E. Budanov ◽  
N. L. Yevich ◽  
N. N. Suslov
Keyword(s):  
Measurement Technique ◽  
Dielectric Materials ◽  
Permittivity Measurement ◽  
Inhomogeneous Dielectric

Measurement Technique for Electrostatic Charge on Single Toner Particles with Microelectromechanical-based Actuated Tweezers

2017 ◽  
Vol 61 (3) ◽  
pp. 305011-305018 ◽  
Author(s):  
Daichi Yamaguchi ◽  
Shuusuke Someno ◽  
Masaya Hamaguchi
Keyword(s):  
Measurement Technique ◽  
Electrostatic Charge

IMPULSE RESPONSE MEASUREMENT TECHNIQUE IN THE MONITOORING CONDITION OF THE EQUIPMENT

2020 ◽  
Vol 0 (3A) ◽  
pp. 186-190
Author(s):  
V. A. Shirokova ◽  
T. V. Barashkova
Keyword(s):  
Impulse Response ◽  
Measurement Technique ◽  
Response Measurement

The Sine Method: An Alternative Height Measurement Technique

2011 ◽  
Author(s):  
Don C. Bragg ◽  
Lee E. Frelich ◽  
Robert T. Leverett ◽  
Will Blozan ◽  
Dale J. Luthringer
Keyword(s):  
Measurement Technique ◽  
Height Measurement

Silicon Fringe Sample Metrology—A Thickness Measurement Technique

2013 ◽  
Author(s):  
Mark Kimball
Keyword(s):  
Temperature Dependence ◽  
Temperature Coefficient ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Sample Thickness ◽  
Index Of Refraction ◽  
Interference Fringes ◽  
Noncontact Method ◽  
Thickness Variations

Abstract Silicon’s index of refraction has a strong temperature coefficient. This temperature dependence can be used to aid sample thinning procedures used for backside analysis, by providing a noncontact method of measuring absolute sample thickness. It also can remove slope ambiguity while counting interference fringes (used to determine the direction and magnitude of thickness variations across a sample).

Single Pulse Emittance Measurement Technique for Intense Relativistic Electron Beam

1997 ◽  
Author(s):  
J. A. Gregor ◽  
R. M. Meger ◽  
J. A. Antoniades
Keyword(s):  
Electron Beam ◽  
Relativistic Electron ◽  
Measurement Technique ◽  
Relativistic Electron Beam ◽  
Single Pulse ◽  
Emittance Measurement

A MORPHOMETRIC STUDY OF THE NORMAL HUMAN EAR IN HUSM USING COMPUTER BASED MEASUREMENT TECHNIQUE

2015 ◽  
Vol 23 (1) ◽  
pp. 45-58
Author(s):  
Nor Azura Mohamed ◽  
◽  
Zainul Ahmad Rajion ◽  
Keyword(s):  
Measurement Technique ◽  
Morphometric Study ◽  
Computer Based ◽  
Normal Human ◽  
Human Ear
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