A New 1000kv Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 100-101
Author(s):  
J.L. Williams ◽  
K. Heathcote ◽  
E.J. Greer
Keyword(s):  
Electron Microscope ◽  
Direct Observation ◽  
High Voltage ◽  
Three Dimensional ◽  
Dimensional Structure ◽  
Specimen Thickness ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
Dynamic Experiments ◽  
Conventional Instrument

High Voltage Electron Microscope already offers exciting experimental possibilities to Biologists and Materials Scientists because the increased specimen thickness allows direct observation of three dimensional structure and dynamic experiments on effectively bulk specimens. This microscope is designed to give maximum accessibility and space in the specimen region for the special stages which are required. At the same time it provides an ease of operation similar to a conventional instrument.

Three dimensional organization of glial cell processes as revealed by high voltage electron microscope stereoscopy

1978 ◽  
Vol 36 (2) ◽  
pp. 18-19
Author(s):  
Kiyoshi Hama ◽  
Toshio Kosaka
Keyword(s):  
Electron Microscope ◽  
Cerebellar Cortex ◽  
High Voltage ◽  
Three Dimensional ◽  
Angular Aperture ◽  
Neuroglial Cell ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Cell Processes

The stereo-observation of biological materials can effectively achieved by the high voltage electron microscope utilizing the high penetration power of electrons at high accelerating voltage which enables the observation of thick specimens, and the large depth of forcus resulted by the small angular aperture used in the electron microscope (Hama, 1972). The high voltage electron microscope was applied to the study of the neuroglial cell processes in the cerebellar cortex of monkey and rat by Chang-Palayand Palay (1972). We investigated further the three dimensional organization of the neuroglial cell processes in the cerebellum and retina of rat by means of high voltage electron microscope stereoscopy.The Golgi preparations of cerebellar cortex and retina of rat were prepared by the methods described previously (Stell and Lightfoot, 1975; Colonnier, 1964). Plastic sections 100 μm thick were used for the light microscope observation.

A side-entry high-precision tilt stage for a high-voltage Electron Microscope

1986 ◽  
Vol 44 ◽  
pp. 628-629
Author(s):  
J.N. Turner ◽  
D.P. Barnard ◽  
G. Matuszek ◽  
C.W. See
Keyword(s):  
Electron Microscope ◽  
High Precision ◽  
High Voltage ◽  
Three Dimensional ◽  
Three Dimensional Reconstruction ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Dimensional Reconstruction ◽  
Electron Microscopes

A high precision specimen stage is essential for the accurate recording of images for three-dimensional reconstruction. The efficient calculation and resolution of a “tomographic type” three-dimensional reconstruction is influenced by the precision of the angular tilt settings. The ability to identify structures at low magnification and later return to them for detailed study at high magnification is crucial to the efficient study of structures by serial section reconstruction, and is greatly aided by a precise, repeatable translation stage. To study such problems, we have designed and fabricated a single-tilt specimen stage for our high-voltage electron microscope (HVEM), which represents a different design philosophy to that usually employed in side entry stages for transmission electron microscopes.

An Improved Double-Tilt Stage for the AEI EM7 High-Voltage Electron Microscope

1980 ◽  
Vol 38 ◽  
pp. 54-55
Author(s):  
J. N. Turner ◽  
A. J. Ratkowski
Keyword(s):  
Degrees Of Freedom ◽  
Three Dimensional ◽  
Dimensional Structure ◽  
Specimen Thickness ◽  
Large Specimen ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
Sampling Statistics ◽  
Image Detail ◽  
Image Details

Specimens approximately a micron thick are routinely examined in the HVEM as a result of its increased penetrating power. This large specimen thickness is advantageous for the study of three-dimensional structure, and it increases the sampling statistics significantly for observing a particular image detail. However, each image in the HVEM represents a volume of the specimen and cannot be assumed to be a plane as is common practice for the CTEM. Therefore, image details in the HVEM often overlap or are not optimally oriented with respect to the beam. Thus, a specimen stage with sufficient degrees of freedom to position the specimen in any orientation relative to beam is required (Turner and Chang, these proceedings). Our double-tilt stage shown in fig. 1 and built by P. R. Swann (1972) has this capability.

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