Measurement of the electromagnetic properties of thin‐films using a microwave resonant cavity

2018 ◽  
Vol 61 (1) ◽  
pp. 15-19
Author(s):  
Radwan Dib ◽  
Didier Vincent ◽  
Ahmad Elrafhi
AIP Advances ◽  
2019 ◽  
Vol 9 (7) ◽  
pp. 075313
Author(s):  
Suye Lü ◽  
Changqing Zhang ◽  
Ge Yu ◽  
Chang Zhao ◽  
Enzhong Tan

1996 ◽  
Author(s):  
J.R. Jr. Thomas ◽  
E.M. Nelson ◽  
R.J. Kares ◽  
R.M. Stringfield

1994 ◽  
Vol 347 ◽  
Author(s):  
Andrzej W. Kraszewski ◽  
Stuart O. Nelson

ABSTRACTThe basis is presented for using a microwave resonant cavity as an effective “contactless balance”, providing information about the mass of dielectric objects inserted into the cavity. An uncertainty analysis presented in the paper confirms that the mass of small dielectric objects can be determined by this technique with an accuracy better than 4%.


1991 ◽  
Vol 19 (2) ◽  
pp. 219-228 ◽  
Author(s):  
M.L. Passow ◽  
M.L. Brake ◽  
P. Lopez ◽  
W.B. McColl ◽  
T.E. Repetti

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