Theory of the Power Spectrum and Scattering Properties of Three-Dimensional Disordered Systems Having a Variable Degree of Short-Range Order. II. Line Spectrum and Cross-Relation Technique

1984 ◽  
Vol 123 (2) ◽  
pp. 403-413 ◽  
Author(s):  
M. Celasco ◽  
P. Mazzetti ◽  
A. Stepanescu
Keyword(s):  
Power Spectrum ◽  
Disordered Systems ◽  
Short Range ◽  
Short Range Order ◽  
Three Dimensional ◽  
Range Order ◽  
Line Spectrum ◽  
Variable Degree

REAL SPACE IMAGING OF SURFACES BY MEANS OF BACKSCATTERED ELECTRONS

1994 ◽  
Vol 08 (28) ◽  
pp. 1759-1769 ◽  
Author(s):  
M. Erbudak ◽  
M. Hochstrasser ◽  
E. Wetli
Keyword(s):  
Short Range ◽  
Short Range Order ◽  
Secondary Electron ◽  
Three Dimensional ◽  
Real Space ◽  
Range Order ◽  
Material System ◽  
Near Surface ◽  
Backscattered Electrons ◽  
Electron Imaging

Secondary electron imaging (SEI) is presented as a new method which allows the investigation of the near surface structure in real time. SEI is based on the observation that electrons backscattered from surfaces in the keV range show a strong enhancement of intensity along directions defined by atomic rows. The spatial imaging of such electrons reveals the symmetry of near surface regions in real space. Three-dimensional views of the solid are readily obtained which makes this method ideally suited for the study of any material system where there is a change of symmetry. SEI is especially useful for the investigation of surfaces with short range order, such as those with submonolayer coverages of growing films, and of quasicrystals possessing only rotational long range order.

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