Measurement of scattered rays from different materials using an inorganic scintillator based optical fiber sensor and its application in radiotherapy

Measurements using an Optical Fiber OFS including an inorganic scintillator placed on the surface of a phantom show that the particle energy distribution inside the phantom remains unchanged. The backscattered intensity measured using an Optical Fiber Sensor (OFS) exhibits a linear relationship with the total radiation dose delivered to the phantom, and this relationship shows that the OFS can be used for indirect dose measurement when located on the surface of the phantom i.e. that arising from the energetic backscattered electrons and photons. Such a device can therefore be used as a clinical in-vivo dosimeter, being located on the patient’s body surface. In addition, the measurement results for the same OFS located inside and outside the radiation field of a compound water based phantom are analyzed. The differences in measurement of the fluorescence signal in response to various tissue materials representing bone or tumor tissue in the irradiation field are strongly related to the material's ability to block the scattered rays from the water phantom, as well as the scattered X-rays generated by the material located within the phantom.

Comparison of Bond Strength in the Different Class of Resin Cements to Cast and CAD/CAM Co-Cr Alloys

Objectives. Despite the widespread use of resin cements in cementing dental restorations, their bond strength to CAD/CAM base metal alloys is not widely studied. This study aimed to evaluate the microshear bond strength (μSBS) between cobalt-chrome (Co-Cr) alloys fabricated using casting or CAD/CAM methods with three types of resin cements. Materials and Methods. Fifty Co-Cr blocks were prepared with CAD/CAM or casting technique. Specimens were divided using primer or not and bonded to three types of resin cements: Panavia F2, RelyX Unicem, and Duo-Link. The differences between the mean μSBS values were analyzed using the two-way ANOVA test and Tukey analysis (α = 0.05). The mode of failure was evaluated using a stereomicroscope. In addition, the specimens were examined by scanning electron microscopy (SEM) based on two received signals: backscattered electrons (SEB) and secondary electrons (SEs). One intact alloy specimen in each group was analyzed by energy-dispersive X-ray spectroscopy (EDX). Results. Most of the specimens in the no-primer group were prematurely debonded. Statistical analyses showed that the interaction between the alloy substrate and cement type was significant ( p = 0.001 ). The bond strength of Panavia F2 was significantly higher than Duo-Link in the CAD/CAM group ( p = 0.001 ). SEM evaluation confirmed the difference in grain structures, while EDX showed no remarkable difference in the chemical composition of the alloy substrates. Conclusion. Alloy fabrication technique may influence the bond strength of resin cements. In the CAD/CAM group, cement containing MDP molecules exhibited higher strength than the etch-and-rinse one.

The Design of a Reflection Electron Energy Loss Spectrometer Attachment for Low Voltage Scanning Electron Microscopy

This paper presents the design of a reflection electron energy spectrometer (REELS) attachment for low voltage scanning electron microscopy (LVSEM) applications. The design is made by carrying out a scattered electron trajectory ray paths simulation. The spectrometer attachment is small enough to fit on the specimen stage of an SEM, and aims to acquire nanoscale spatially resolved REELS information. It uses a retarding field electrostatic toroidal sector energy analyzer design, which is able to lower the kinetic energies of elastically backscattered electrons to pass energies of 10 eV or less. For the capture of 1 keV BSEs emitted in the polar angular range between 40 to 50°, direct ray-tracing simulations predict that the spectrometer attachment will have an energy resolution of around 0.4 eV at a pass energy of 10 eV, and 0.2 eV at a pass energy of 5 eV. This predicted performance will make it a suitable REELS attachment for SEMs that use field emission electron sources.

Determining Grain Boundary Position and Geometry from EBSD Data: Limits of Accuracy

As the feature size of crystalline materials gets smaller, the ability to correctly interpret geometrical sample information from electron backscatter diffraction (EBSD) data becomes more important. This paper uses the notion of transition curves, associated with line scans across grain boundaries (GBs), to correctly account for the finite size of the excitation volume (EV) in the determination of the geometry of the boundary. Various metrics arising from the EBSD data are compared to determine the best experimental proxy for actual numbers of backscattered electrons that are tracked in a Monte Carlo simulation. Consideration of the resultant curves provides an accurate method of determining GB position (at the sample surface) and indicates a significant potential for error in determining GB position using standard EBSD software. Subsequently, simple criteria for comparing experimental and simulated transition curves are derived. Finally, it is shown that the EV is too shallow for the curves to reveal subsurface geometry of the GB (i.e., GB inclination angle) for most values of GB inclination.

144Ce - 144Pr spectrum measurement with 4π semiconductor β-spectrometer

Precision β-spectra measurement always had a great importance in some fundamental physics problems including neutrino physics. Magnetic and electrostatic spectrometers have high resolution, but at the same time usage of such kinds of equipment involves the size and cost issues. Since electron mean free path at the energy of 3 MeV (which is basically the maximum energy of a β-transition for the long-lived nuclei) does not exceed 2 g/crn2 , electron registration could be effectively performed with the solid state scintillators and semiconductors. A strong probability of backscattering from detector surface is present in case of semiconductor detectors and is dependent upon the detector material. Such problem can be solved with 4π geometry detector development, which fully covers the radioactive source and is able to register the backscattered electrons. In this work we present the newly developed technology of 4π geometry β-spectrometer based on two semiconductor detectors. This spectrometer was used for measurement of the 144Ce - 144Pr spectrum, that is the perspective anti-neutrino source due to endpoint energy at 3 MeV and can be used for the sterile neutrino search experiments. The form-factor parameters that were obtained are: C(W) = 1 + (-0.02877 ± 0.00028)W + (-0.11722 ± 0.00297)W-1. The measurement accuracy was sufficiently enhanced with respect to the previous results.

Influence of homogenization preceding to cold-rolling on the microstructure of the AA-3003

The aluminum alloy AA3003 produced by a direct chill continuous casting process has a microstructure that significantly affects its potential use in engineering applications. This work studies the effects of the homogenizing heat treatment on the microstructure of AA3003 with cold working. Six conditions were studied, combining the variables initial condition (with and without homogenizing) and amount of cold working. All conditions were evaluated by means of optical and scanning electron microscopy, in combination with backscattered electrons and energy dispersive X ray spectroscopy techniques. Results suggest that for both initial conditions, the secondary phases present are Al6(Mn,Fe) and α-Al(Mn,Fe)Si, which vary in number, size, and shape. The homogenization caused the dissolution and precipitation of dispersoids, in addition to the spheroidization of primary particles, and minor variation of the size of secondary particles during cold working. Secondary phases are composed of primary and secondary particles, which differ in their Fe and Mn content, resulting in a lower Mn/Fe ratio for the primary particles (0,57 for the as‑received condition and 0,80 for the homogenized condition), whereas the dispersoids have a higher Mn/Fe ratio (1,56 after the homogenization). Homogenization increased ductility and reduced the likelihood of cracking during cold working. This was evidenced by the results obtained for strength, hardness, and ductility.

Influence of homogenization preceding to cold-rolling on the microstructure of the AA-3003

The aluminum alloy AA3003 produced by a direct chill continuous casting process has a microstructure that significantly affects its potential use in engineering applications. This work studies the effects of the homogenizing heat treatment on the microstructure of AA3003 with cold working. Six conditions were studied, combining the variables initial condition (with and without homogenizing) and amount of cold working. All conditions were evaluated by means of optical and scanning electron microscopy, in combination with backscattered electrons and energy dispersive X ray spectroscopy techniques. Results suggest that for both initial conditions, the secondary phases present are Al6(Mn,Fe) and α-Al(Mn,Fe)Si, which vary in number, size, and shape. The homogenization caused the dissolution and precipitation of dispersoids, in addition to the spheroidization of primary particles, and minor variation of the size of secondary particles during cold working. Secondary phases are composed of primary and secondary particles, which differ in their Fe and Mn content, resulting in a lower Mn/Fe ratio for the primary particles (0,57 for the as‑received condition and 0,80 for the homogenized condition), whereas the dispersoids have a higher Mn/Fe ratio (1,56 after the homogenization). Homogenization increased ductility and reduced the likelihood of cracking during cold working. This was evidenced by the results obtained for strength, hardness, and ductility.

Effect of Chemical Composition on Magnetic and Electrical Properties of Ferroelectromagnetic Ceramic Composites

In this paper, ferroelectric–ferrimagnetic ceramic composites based on multicomponent PZT-type (PbZr1-xTixO3-type) material and ferrite material with different percentages in composite compositions were obtained and studied. The ferroelectric component of the composite was a perovskite ceramic material with the chemical formula Pb0.97Bi0.02(Zr0.51Ti0.49)0.98(Nb2/3Mn1/3)0.02O3 (P), whereas the magnetic component was nickel-zinc ferrite with the chemical formula Ni0.5Zn0.5Fe2O4 (F). The process of sintering the composite compounds was carried out by the free sintering method. Six ferroelectric-ferrimagnetic ceramic P-F composite compounds were designed and obtained with different percentages of its components, i.e., 90/10 (P90-F10), 85/15 (P85-F15), 80/20 (P80-F20), 60/40 (P60-F40), 40/60 (P40-F60), and 20/80 (P20-F80). X-ray diffraction patterns, microstructural, ferroelectric, dielectric, magnetic properties, and DC electrical conductivity of the composite materials were investigated. In this study, two techniques were used to image the microstructure of P-F composite samples: SB (detection of the signals from the secondary and backscattered electron detectors) and BSE (detection of backscattered electrons), which allowed accurate visualization of the presence and distribution of the magnetic and ferroelectric component in the volume of the composite samples. The studies have shown that at room temperature, the ceramic composite samples exhibit good magnetic and electrical properties. The best set of physical properties and performance of composite compositions have ceramic samples with a dominant phase of ferroelectric component and a small amount of the ferrite component (P90-F10). Such a composition retains the high ferroelectric properties of the ferroelectric component in the composite while also acquiring magnetic properties. These properties can be prospectively used in new types of memory and electromagnetic converters.