scholarly journals A one‐class peeling method for multivariate outlier detection with applications in phase I SPC

2020 ◽  
Vol 36 (4) ◽  
pp. 1272-1295
Author(s):  
Waldyn G. Martinez ◽  
Maria L. Weese ◽  
L. Allison Jones-Farmer
2021 ◽  
Vol 181 ◽  
pp. 1146-1153
Author(s):  
Pedro Aguiar ◽  
António Cunha ◽  
Matus Bakon ◽  
Antonio M. Ruiz-Armenteros ◽  
Joaquim J. Sousa

2021 ◽  
Vol 11 (1) ◽  
pp. 69-84
Author(s):  
G. S. David Sam Jayakumar ◽  
Bejoy John Thomas

2020 ◽  
Vol 52 (8) ◽  
pp. 1049-1066
Author(s):  
Peter Filzmoser ◽  
Mariella Gregorich

AbstractOutliers are encountered in all practical situations of data analysis, regardless of the discipline of application. However, the term outlier is not uniformly defined across all these fields since the differentiation between regular and irregular behaviour is naturally embedded in the subject area under consideration. Generalized approaches for outlier identification have to be modified to allow the diligent search for potential outliers. Therefore, an overview of different techniques for multivariate outlier detection is presented within the scope of selected kinds of data frequently found in the field of geosciences. In particular, three common types of data in geological studies are explored: spatial, compositional and flat data. All of these formats motivate new outlier concepts, such as local outlyingness, where the spatial information of the data is used to define a neighbourhood structure. Another type are compositional data, which nicely illustrate the fact that some kinds of data require not only adaptations to standard outlier approaches, but also transformations of the data itself before conducting the outlier search. Finally, the very recently developed concept of cellwise outlyingness, typically used for high-dimensional data, allows one to identify atypical cells in a data matrix. In practice, the different data formats can be mixed, and it is demonstrated in various examples how to proceed in such situations.


Mathematics ◽  
2020 ◽  
Vol 8 (5) ◽  
pp. 857 ◽  
Author(s):  
Ishaq Adeyanju Raji ◽  
Muhammad Hisyam Lee ◽  
Muhammad Riaz ◽  
Mu’azu Ramat Abujiya ◽  
Nasir Abbas

Shewhart control charts with estimated control limits are widely used in practice. However, the estimated control limits are often affected by phase-I estimation errors. These estimation errors arise due to variation in the practitioner’s choice of sample size as well as the presence of outlying errors in phase-I. The unnecessary variation, due to outlying errors, disturbs the control limits implying a less efficient control chart in phase-II. In this study, we propose models based on Tukey and median absolute deviation outlier detectors for detecting the errors in phase-I. These two outlier detection models are as efficient and robust as they are distribution free. Using the Monte-Carlo simulation method, we study the estimation effect via the proposed outlier detection models on the Shewhart chart in the normal as well as non-normal environments. The performance evaluation is done through studying the run length properties namely average run length and standard deviation run length. The findings of the study show that the proposed design structures are more stable in the presence of outlier detectors and require less phase-I observation to stabilize the run-length properties. Finally, we implement the findings of the current study in the semiconductor manufacturing industry, where a real dataset is extracted from a photolithography process.


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