Application of experimentally determined inelastic mean free path and surface excitation parameter in Ni to Monte Carlo simulation of reflection electron energy loss spectrum

2008 ◽  
Vol 40 (13) ◽  
pp. 1755-1759 ◽  
Author(s):  
T. Nagatomi ◽  
K. Goto
2006 ◽  
Vol 12 (S02) ◽  
pp. 1186-1187 ◽  
Author(s):  
Q Jin ◽  
D Li

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006


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