Electron inelastic mean free path and dielectric properties of a-boron, a-carbon, and their nitrides as determined by quantitative analysis of reflection electron energy loss spectroscopy

2006 ◽  
Vol 24 (3) ◽  
pp. 396-407 ◽  
Author(s):  
P. Prieto ◽  
C. Quirós ◽  
E. Elizalde ◽  
J. M. Sanz
Keyword(s):  
Quantitative Analysis ◽  
Dielectric Properties ◽  
Energy Loss ◽  
Free Path ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Mean Free Path ◽  
Inelastic Mean Free Path ◽  
Electron Energy Loss

scholarly journals Determining Inelastic Mean Free Path by Electron Energy Loss Spectroscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 1186-1187 ◽  
Author(s):  
Q Jin ◽  
D Li
Keyword(s):  
Energy Loss ◽  
Free Path ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Mean Free Path ◽  
Inelastic Mean Free Path ◽  
Electron Energy Loss

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

The Influence of Specimen Thickness in Quantitative Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 112-113
Author(s):  
Nestor J. Zaluzec
Keyword(s):  
Quantitative Analysis ◽  
Adverse Effects ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Light Element ◽  
Specimen Thickness ◽  
Element Analysis ◽  
Electron Energy Loss

The application of electron energy loss spectroscopy (EELS) to light element analysis is rapidly becoming an important aspect of the microcharacterization of solids in materials science, however relatively stringent requirements exist on the specimen thickness under which one can obtain EELS data due to the adverse effects of multiple inelastic scattering.1,2 This study was initiated to determine the limitations on quantitative analysis of EELS data due to specimen thickness.

A Poor Man’s Approach to Semi-Quantitative Analysis with Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 110-111
Author(s):  
M. Isaacson
Keyword(s):  
Quantitative Analysis ◽  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Electron Energy Loss Spectroscopy ◽  
Excitation Cross Section ◽  
Incident Electron ◽  
Integral Cross Section ◽  
Image Position ◽  
Electron Energy Loss

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.

Dielectric properties of ZrN, NbC, and NbN as determined by electron-energy-loss spectroscopy

1985 ◽  
Vol 31 (3) ◽  
pp. 1244-1247 ◽  
Author(s):  
J. Pflüger ◽  
J. Fink ◽  
W. Weber ◽  
K.-P. Bohnen ◽  
G. Crecelius
Keyword(s):  
Dielectric Properties ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Electron Energy Loss
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