Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si

2010 ◽  
Vol 42 (8) ◽  
pp. 1393-1401 ◽  
Author(s):  
Christine M. Mahoney
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Cluster Sims ◽  
Sims Depth Profiling

Investigating the chain conformations of spin-coated polymer thin films by ToF-SIMS depth profiling

2015 ◽  
Vol 47 (10) ◽  
pp. 953-960 ◽  
Author(s):  
Xianwen Ren ◽  
Lu-Tao Weng ◽  
Yi Fu ◽  
Kai-Mo Ng ◽  
Chi-Ming Chan
Keyword(s):  
Thin Films ◽  
Polymer Thin Films ◽  
Depth Profiling ◽  
Tof Sims ◽  
Chain Conformations ◽  
Sims Depth Profiling

Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams

2008 ◽  
Vol 255 (4) ◽  
pp. 1338-1340
Author(s):  
Yukio Fujiwara ◽  
Kouji Kondou ◽  
Kouji Watanabe ◽  
Hidehiko Nonaka ◽  
Naoaki Saito ◽  
...  
Keyword(s):  
Metal Cluster ◽  
Depth Profiling ◽  
Ion Beams ◽  
Factorial Analysis ◽  
Cluster Complex ◽  
Cluster Sims ◽  
Sims Depth Profiling ◽  
Complex Ion

Distribution of intercalated lithium in V2O5 thin films determined by SIMS depth profiling

2006 ◽  
Vol 38 (4) ◽  
pp. 847-850 ◽  
Author(s):  
D. Alamarguy ◽  
J. E. Castle ◽  
M. Liberatore ◽  
F. Decker
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
V2o5 Thin Films ◽  
Sims Depth Profiling

Investigation of Hg sorption and diffusion behavior on ultra-thin films of gold using QCM response analysis and SIMS depth profiling

2012 ◽  
Vol 22 (39) ◽  
pp. 20929 ◽  
Author(s):  
Ylias M. Sabri ◽  
Samuel J. Ippolito ◽  
Mohammad Al Kobaisi ◽  
Matthew J. Griffin ◽  
David R. Nelson ◽  
...  
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Response Analysis ◽  
Diffusion Behavior ◽  
And Diffusion ◽  
Sims Depth Profiling

Determination of the sputtering yield of cholesterol using Arn+ and C60+(+) cluster ions

The Analyst ◽  
2016 ◽  
Vol 141 (16) ◽  
pp. 4893-4901 ◽  
Author(s):  
P. D. Rakowska ◽  
M. P. Seah ◽  
J.-L. Vorng ◽  
R. Havelund ◽  
I. S. Gilmore
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Cluster Ions ◽  
Sputtering Yield ◽  
Sims Depth Profiling

Comparison of C60+(+) and Arn+ as sputtering ions for SIMS depth profiling of cholesterol thin films.

Improved quantitative analysis of Cu(In,Ga)Se2 thin films using MCs+-SIMS depth profiling

2013 ◽  
Vol 115 (4) ◽  
pp. 1355-1364 ◽  
Author(s):  
Jihye Lee ◽  
Seon Hee Kim ◽  
Kang-Bong Lee ◽  
Byoung Koun Min ◽  
Yeonhee Lee
Keyword(s):  
Thin Films ◽  
Quantitative Analysis ◽  
Depth Profiling ◽  
Sims Depth Profiling
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