Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams

2008 ◽  
Vol 255 (4) ◽  
pp. 1338-1340
Author(s):  
Yukio Fujiwara ◽  
Kouji Kondou ◽  
Kouji Watanabe ◽  
Hidehiko Nonaka ◽  
Naoaki Saito ◽  
...  
Keyword(s):  
Metal Cluster ◽  
Depth Profiling ◽  
Ion Beams ◽  
Factorial Analysis ◽  
Cluster Complex ◽  
Cluster Sims ◽  
Sims Depth Profiling ◽  
Complex Ion

scholarly journals Production and Applications of Metal-cluster-complex Ion Beams

2009 ◽  
Vol 52 (4) ◽  
pp. 231-236
Author(s):  
Yukio FUJIWARA ◽  
Kouji KONDOU ◽  
Yoshikazu TERANISHI ◽  
Kouji WATANABE ◽  
Hidehiko NONAKA ◽  
...  
Keyword(s):  
Metal Cluster ◽  
Ion Beams ◽  
Cluster Complex ◽  
Complex Ion

ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 190-193 ◽  
Author(s):  
Nimer Wehbe ◽  
Laurent Houssiau
Keyword(s):  
Vitamin C ◽  
Depth Profiling ◽  
Ion Beams ◽  
Tof Sims ◽  
Sims Depth Profiling

Production of Stable Ion Beam of Os3(CO)12with Compact Metal-Cluster-Complex Ion Source

2006 ◽  
Vol 45 (7) ◽  
pp. 6000-6007 ◽  
Author(s):  
Yukio Fujiwara ◽  
Kouji Kondou ◽  
Yoshikazu Teranishi ◽  
Hidehiko Nonaka ◽  
Toshiyuki Fujimoto ◽  
...  
Keyword(s):  
Metal Cluster ◽  
Ion Beam ◽  
Ion Source ◽  
Cluster Complex ◽  
Complex Ion

scholarly journals Incident Angle Dependence in Polymer TOF-SIMS Depth Profiling with C60 Ion Beams

2009 ◽  
Vol 7 ◽  
pp. 878-881 ◽  
Author(s):  
Shin-ichi Iida ◽  
Takuya Miyayama ◽  
Noriaki Sanada ◽  
Mineharu Suzuki ◽  
Gregory L. Fisher ◽  
...  
Keyword(s):  
Incident Angle ◽  
Depth Profiling ◽  
Ion Beams ◽  
Angle Dependence ◽  
Tof Sims ◽  
Sims Depth Profiling

scholarly journals High depth resolution SIMS analysis using metal cluster complex ion bombardment

2008 ◽  
Vol 100 (1) ◽  
pp. 012001 ◽  
Author(s):  
M Tomita ◽  
T Kinno ◽  
M Koike ◽  
H Tanaka ◽  
S Takeno ◽  
...  
Keyword(s):  
Metal Cluster ◽  
Depth Resolution ◽  
Ion Bombardment ◽  
Cluster Complex ◽  
Sims Analysis ◽  
High Depth ◽  
Complex Ion

Secondary Ion Mass Spectrometry of Organic Thin Films Using Metal-Cluster-Complex Ion Source

2006 ◽  
Vol 45 (No. 36) ◽  
pp. L987-L990 ◽  
Author(s):  
Yukio Fujiwara ◽  
Kouji Kondou ◽  
Hidehiko Nonaka ◽  
Naoaki Saito ◽  
Hiroshi Itoh ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
Secondary Ion Mass Spectrometry ◽  
Metal Cluster ◽  
Organic Thin Films ◽  
Ion Source ◽  
Cluster Complex ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Complex Ion

Cluster SIMS using metal cluster complex ions

2008 ◽  
Vol 255 (4) ◽  
pp. 916-921 ◽  
Author(s):  
Yukio Fujiwara ◽  
Kouji Kondou ◽  
Yoshikazu Teranishi ◽  
Kouji Watanabe ◽  
Hidehiko Nonaka ◽  
...  
Keyword(s):  
Metal Cluster ◽  
Cluster Complex ◽  
Complex Ions ◽  
Cluster Sims
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