Influence of local temperature field on propagation of a curvilinear crack with interfacial bonds

To study the effect of the temperature field and gradient of a steel-concrete composite box girder bridge, a 5 × 35 continuous composite box girder bridge is used as the research object. The temperature measuring point is set by selecting a typical cross section, and the temperature change data are measured. The temperature field of the different positions in the composite box girder bridge is studied, the global and local temperature differences are compared, and the law of temperature distribution and the main factors affecting the temperature field are formulated. The most unfavourable expression function of the vertical temperature gradient of the section is simulated using the measured data, the existing standard temperature gradient mode is compared, the finite element model of the bridge is established, and the influence of the actual temperature gradient mode on the stress and deformation of the composite girder is further analysed. The conclusions show that the temperature differences of different azimuth sections and the local temperature differences between the steel and concrete joint parts of the steel-concrete composite box girder bridge are not significant. The temperature gradient heating and cooling model fitted by the measured temperature field can be used as a reference for the structural design of similar local bridges.

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Characteristics and Application of Temperature-Field Emitters

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100114347 ◽

1975 ◽

Vol 33 ◽

pp. 144-145

Author(s):

N. Tamura ◽

T. Goto ◽

Y. Harada

Keyword(s):

Temperature Field ◽

Electron Microscope ◽

Field Emission ◽

Resolving Power ◽

High Brightness ◽

Field Emitters ◽

Emission Electron ◽

Sufficient Stability ◽

Scanning Electron ◽

Illuminating System

On account of its high brightness, the field emission electron source has the advantage that it provides the conventional electron microscope with highly coherent illuminating system and that it directly improves the, resolving power of the scanning electron microscope. The present authors have reported some results obtained with a 100 kV field emission electron microscope.It has been proven, furthermore, that the tungsten emitter as a temperature field emission source can be utilized with a sufficient stability under a modest vacuum of 10-8 ~ 10-9 Torr. The present paper is concerned with an extension of our study on the characteristics of the temperature field emitters.

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Multiple-fracturing and viewing of the same frozen sample at different depths using a low temperature FESEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100166567 ◽

1996 ◽

Vol 54 ◽

pp. 820-821

Author(s):

M.V. Parthasarathy ◽

C. Daugherty

Keyword(s):

Temperature Field ◽

Low Temperature ◽

Field Emission ◽

Multiple Fracture ◽

Precise Control ◽

Cold Stage ◽

Different Depths ◽

Transfer Device

The versatility of Low Temperature Field Emission SEM (LTFESEM) for viewing frozen-hydrated biological specimens, and the high resolutions that can be obtained with such instruments have been well documented. Studies done with LTFESEM have been usually limited to the viewing of small organisms, organs, cells, and organelles, or viewing such specimens after fracturing them.We use a Hitachi 4500 FESEM equipped with a recently developed BAL-TEC SCE 020 cryopreparation/transfer device for our LTFESEM studies. The SCE 020 is similar in design to the older SCU 020 except that instead of having a dedicated stage, the SCE 020 has a detachable cold stage that mounts on to the FESEM stage when needed. Since the SCE 020 has a precisely controlled lock manipulator for transferring the specimen table from the cryopreparation chamber to the cold stage in the FESEM, and also has a motor driven microtome for precise control of specimen fracture, we have explored the feasibility of using the LTFESEM for multiple-fracture studies of the same sample.

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