Maximum Likelihood Estimation in Progressive Type-II Censoring

2014 ◽  
pp. 267-312
Author(s):  
N. Balakrishnan ◽  
Erhard Cramer
Mathematics ◽  
2019 ◽  
Vol 7 (4) ◽  
pp. 361 ◽  
Author(s):  
Yuge Du ◽  
Wenhao Gui

In this paper, we propose two new methods to perform goodness-of-fit tests on the log-logistic distribution under progressive Type II censoring based on the cumulative residual Kullback-Leibler information and cumulative Kullback-Leibler information. Maximum likelihood estimation and the EM algorithm are used for statistical inference of the unknown parameter. The Monte Carlo simulation is conducted to study the power analysis on the alternative distributions of the hazard function monotonically increasing and decreasing. Finally, we present illustrative examples to show the applicability of the proposed methods.


Axioms ◽  
2021 ◽  
Vol 10 (2) ◽  
pp. 100
Author(s):  
Hisham M. Almongy ◽  
Fatma Y. Alshenawy ◽  
Ehab M. Almetwally ◽  
Doaa A. Abdo

In this paper, the Weibull extension distribution parameters are estimated under a progressive type-II censoring scheme with random removal. The parameters of the model are estimated using the maximum likelihood method, maximum product spacing, and Bayesian estimation methods. In classical estimation (maximum likelihood method and maximum product spacing), we did use the Newton–Raphson algorithm. The Bayesian estimation is done using the Metropolis–Hastings algorithm based on the square error loss function. The proposed estimation methods are compared using Monte Carlo simulations under a progressive type-II censoring scheme. An empirical study using a real data set of transformer insulation and a simulation study is performed to validate the introduced methods of inference. Based on the result of our study, it can be concluded that the Bayesian method outperforms the maximum likelihood and maximum product-spacing methods for estimating the Weibull extension parameters under a progressive type-II censoring scheme in both simulation and empirical studies.


Sign in / Sign up

Export Citation Format

Share Document