Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-Chip Test Data Compression/Decompression
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2010 ◽
Vol 26
(6)
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pp. 679-688
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2004 ◽
Vol 20
(2)
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pp. 199-212
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2013 ◽
Vol 27
(1)
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pp. 76-82
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2009 ◽
Vol E92-D
(7)
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pp. 1462-1465
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