Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-Chip Test Data Compression/Decompression

Author(s):  
Paul Theo Gonciari ◽  
Bashir M. Al-Hashimi ◽  
Nicola Nicolici
2016 ◽  
Vol 07 (08) ◽  
pp. 1213-1223
Author(s):  
J. Robert Theivadas ◽  
V. Ranganathan ◽  
J. Raja Paul Perinbam

2016 ◽  
Vol 32 (5) ◽  
pp. 639-647
Author(s):  
Haiying Yuan ◽  
Zijian Ju ◽  
Xun Sun ◽  
Kun Guo ◽  
Xiuyu Wang

2013 ◽  
Vol 27 (1) ◽  
pp. 76-82 ◽  
Author(s):  
Yiming Ouyang ◽  
Guilin Huang ◽  
Huaguo Liang ◽  
Tao Xie ◽  
Zhengfeng Huang

2020 ◽  
Vol 36 (5) ◽  
pp. 577-590
Author(s):  
Azhaganantham Arulmurugan ◽  
Govindasamy Murugesan ◽  
Balasubramaniam Vivek

2009 ◽  
Vol E92-D (7) ◽  
pp. 1462-1465 ◽  
Author(s):  
Yongjoon KIM ◽  
Myung-Hoon YANG ◽  
Jaeseok PARK ◽  
Eunsei PARK ◽  
Sungho KANG

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