Design, Automation, and Test in Europe
Latest Publications

TOTAL DOCUMENTS

36

(FIVE YEARS 0)

H-INDEX

5

(FIVE YEARS 0)

Published By Springer Netherlands

9781402064876, 9781402064883

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

What If You Could Design Tomorrow’s System Today?

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_7 ◽

2008 ◽

pp. 87-101

Author(s):

Neal Wingen

Keyword(s):

System Today

Lock-Free Synchronization for Dynamic Embedded Real-Time Systems

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_6 ◽

2008 ◽

pp. 73-85 ◽

Cited By ~ 1

Author(s):

Hyeonjoong Cho ◽

Binoy Ravindran ◽

E. Douglas Jensen

Keyword(s):

Real Time ◽

Real Time Systems ◽

Time Systems

Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-Chip Test Data Compression/Decompression

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_35 ◽

2008 ◽

pp. 479-495

Author(s):

Paul Theo Gonciari ◽

Bashir M. Al-Hashimi ◽

Nicola Nicolici

Keyword(s):

Data Compression ◽

Test Data ◽

Compression Ratio ◽

System On Chip ◽

Test Data Compression ◽

Application Time ◽

Test Application Time ◽

Area Overhead ◽

Test Application ◽

On Chip

Efficient Spectral Techniques for Sequential ATPG

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_33 ◽

2008 ◽

pp. 455-464

Author(s):

Ashish Giani ◽

Shuo Sheng ◽

Michael S. Hsiao ◽

Vishwani D. Agrawal

Keyword(s):

Spectral Techniques

System Level Design: Past, Present, and Future

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_1 ◽

2008 ◽

pp. 3-14

Author(s):

Daniel D. Gajski

Keyword(s):

System Level ◽

System Level Design ◽

Level Design

Interconnect Tuning Strategies for High-Performance ICs

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_26 ◽

2008 ◽

pp. 359-376 ◽

Cited By ~ 1

Author(s):

Andrew B. Kahng ◽

Sudhakar Muddu ◽

Egino Sarto ◽

Rahul Sharma

Keyword(s):

High Performance

BerkMin: A Fast and Robust Sat-Solver

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_34 ◽

2008 ◽

pp. 465-478 ◽

Cited By ~ 1

Author(s):

Evgueni Goldberg ◽

Yakov Novikov

Keyword(s):

Sat Solver

A Single Photon Avalanche Diode Array Fabricated in Deep-Submicron CMOS Technology

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_29 ◽

2008 ◽

pp. 401-413

Author(s):

Cristiano Niclass ◽

Maximilian Sergio ◽

Edoardo Charbon

Keyword(s):

Single Photon ◽

Cmos Technology ◽

Deep Submicron ◽

Diode Array ◽

Avalanche Diode ◽

Submicron Cmos

An Effective Technique for Minimizing the Cost of Processor Software-Based Diagnosis in SoCs

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_36 ◽

2008 ◽

pp. 497-509

Author(s):

P. Bernardi ◽

E. Sánchez ◽

M. Schillaci ◽

G. Squillero ◽

M. Sonza Reorda

Keyword(s):

Effective Technique ◽

The Cost

Physical Design and Validation

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_25 ◽

2008 ◽

pp. 347-358

Author(s):

Jochen A. G. Jess

Keyword(s):

Physical Design