Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

Yongjoon KIM; Myung-Hoon YANG; Jaeseok PARK; Eunsei PARK; Sungho KANG

doi:10.1587/transinf.e92.d.1462

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

IEICE Transactions on Information and Systems ◽

10.1587/transinf.e92.d.1462 ◽

2009 ◽

Vol E92-D (7) ◽

pp. 1462-1465 ◽

Cited By ~ 2

Author(s):

Yongjoon KIM ◽

Myung-Hoon YANG ◽

Jaeseok PARK ◽

Eunsei PARK ◽

Sungho KANG

Keyword(s):

Test Data ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Data Volume

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Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.70 ◽

2010 ◽

Cited By ~ 1

Author(s):

Zhiqiang You ◽

Jiedi Huang ◽

Michiko Inoue ◽

Jishun Kuang ◽

Hideo Fujiwara

Keyword(s):

Test Data ◽

Application Time ◽

Test Power ◽

Test Application Time ◽

Test Application ◽

Data Volume

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Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time

11th Pacific Rim International Symposium on Dependable Computing (PRDC'05) ◽

10.1109/prdc.2005.26 ◽

2006 ◽

Cited By ~ 3

Author(s):

Yu Hu ◽

Xiao-Wei Li ◽

Hua-Wei Li ◽

Xiao-Qing Wen

Keyword(s):

Test Data ◽

Power Dissipation ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Data Volume

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An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time

2006 15th Asian Test Symposium ◽

10.1109/ats.2006.260952 ◽

2006 ◽

Cited By ~ 12

Author(s):

Zhanglei Wang ◽

Krishnendu Chakrabarty

Keyword(s):

Test Data ◽

Test Pattern ◽

Selection Method ◽

Pattern Selection ◽

Defect Coverage ◽

Application Time ◽

Test Application Time ◽

Efficient Test ◽

Test Application ◽

Data Volume

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Reducing test application time, test data volume and test power through Virtual Chain Partition

Integration ◽

10.1016/j.vlsi.2008.12.001 ◽

2009 ◽

Vol 42 (3) ◽

pp. 385-399 ◽

Cited By ~ 4

Author(s):

José M. Solana

Keyword(s):

Test Data ◽

Application Time ◽

Test Power ◽

Test Application Time ◽

Test Application ◽

Data Volume ◽

Time Test ◽

Chain Partition

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Reduction of test data volume and test application time by scan chain disabling technique

Journal of the Chinese Institute of Engineers ◽

10.1080/02533839.2012.701871 ◽

2012 ◽

Vol 35 (6) ◽

pp. 687-696

Author(s):

Lung-Jen Lee ◽

Wang-Dauh Tseng ◽

Rung-Bin Lin

Keyword(s):

Test Data ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Data Volume ◽

Scan Chain

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Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction

25th IEEE VLSI Test Symmposium (VTS'07) ◽

10.1109/vts.2007.39 ◽

2007 ◽

Cited By ~ 18

Author(s):

Anshuman Chandra ◽

Haihua Yan ◽

Rohit Kapur

Keyword(s):

Test Data ◽

Volume Reduction ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Data Volume

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Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time

2009 Asian Test Symposium ◽

10.1109/ats.2009.17 ◽

2009 ◽

Cited By ~ 2

Author(s):

Michael S. Hsiao ◽

Mainak Banga

Keyword(s):

Test Data ◽

Application Time ◽

High Coverage ◽

Test Application Time ◽

Test Application ◽

Data Volume

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On reducing test data volume and test application time for multiple scan chain designs

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271096 ◽

2004 ◽

Cited By ~ 21

Author(s):

Huaxing Tang ◽

S.M. Reddy ◽

I. Pomeranz

Keyword(s):

Test Data ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Multiple Scan ◽

Data Volume ◽

Scan Chain

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The Economics of Implementing Scan Compression to Reduce Test Data Volume and Test Application Time

2006 IEEE International Test Conference ◽

10.1109/test.2006.297739 ◽

2006 ◽

Cited By ~ 2

Author(s):

Chris Allsup

Keyword(s):

Test Data ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Data Volume

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Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4388034 ◽

2007 ◽

Author(s):

Dong Xiang ◽

Krishnendu Chakrabarty ◽

Dianwei Hu ◽

Hideo Fujiwara

Keyword(s):

Test Data ◽

Path Delay ◽

Application Time ◽

Path Delay Faults ◽

Complete Coverage ◽

Hardware Cost ◽

Scan Testing ◽

Test Application Time ◽

Test Application ◽

Data Volume

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