Photoelectron Counting Statistics for the Degenerate Parametric Oscillator

1990 ◽  
pp. 1239-1242
Author(s):  
M. Wolinsky ◽  
H. J. Carmichael
Keyword(s):  
Parametric Oscillator ◽  
Counting Statistics

Radiation Damage, Contrast and Statistics in High Resolution Biological Electron Microscopy

1970 ◽  
Vol 28 ◽  
pp. 260-261
Author(s):  
Robert M. Glaeser
Keyword(s):  
High Resolution ◽  
Particle Flux ◽  
Unit Area ◽  
Signal To Noise ◽  
Resolution Image ◽  
High Resolution Image ◽  
Pass Through ◽  
Counting Statistics ◽  
The Relationship ◽  
Picture Element

It is well known that a large flux of electrons must pass through a specimen in order to obtain a high resolution image while a smaller particle flux is satisfactory for a low resolution image. The minimum particle flux that is required depends upon the contrast in the image and the signal-to-noise (S/N) ratio at which the data are considered acceptable. For a given S/N associated with statistical fluxtuations, the relationship between contrast and “counting statistics” is s131_eqn1, where C = contrast; r2 is the area of a picture element corresponding to the resolution, r; N is the number of electrons incident per unit area of the specimen; f is the fraction of electrons that contribute to formation of the image, relative to the total number of electrons incident upon the object.

CW diode-pumped optical parametric oscillator in bulk periodically poled LiNbO3

1995 ◽  
Vol 31 (21) ◽  
pp. 1869-1870 ◽  
Author(s):  
L.E. Myers ◽  
M.M. Fejer ◽  
R.C. Eckardt ◽  
J.W. Pierce ◽  
R.L. Byer
Keyword(s):  
Optical Parametric Oscillator ◽  
Parametric Oscillator ◽  
Periodically Poled ◽  
Optical Parametric ◽  
Diode Pumped
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