Measurement of Residual Stresses in Diamond Coated Substrates Utilizing Coherent Light Projection Moiré Interferometry

2011 ◽  
pp. 209-217 ◽  
Author(s):  
C. A. Sciammarella ◽  
A. Boccaccio ◽  
M. C. Frassanito ◽  
L. Lamberti ◽  
C. Pappalettere
Keyword(s):  
Residual Stresses ◽  
Moiré Interferometry ◽  
Moire Interferometry ◽  
Coherent Light ◽  
Projection Moire

Measurements of Deflection and Residual Stress in Thin Films Utilizing Coherent Light Reflection/Projection Moiré Interferometry

2013 ◽  
Vol 53 (6) ◽  
pp. 977-987 ◽  
Author(s):  
C. A. Sciammarella ◽  
A. Boccaccio ◽  
L. Lamberti ◽  
C. Pappalettere ◽  
A. Rizzo ◽  
...  
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Moiré Interferometry ◽  
Light Reflection ◽  
Moire Interferometry ◽  
Coherent Light ◽  
Projection Moire

Experimental Investigation of Residual Stresses in Layered Materials Using Moire´ Interferometry

2002 ◽  
Vol 124 (4) ◽  
pp. 340-344 ◽  
Author(s):  
Keith B. Bowman ◽  
David H. Mollenhauer
Keyword(s):  
Residual Stresses ◽  
Thermal Loading ◽  
Elevated Temperatures ◽  
Dissimilar Materials ◽  
Layered Materials ◽  
Moiré Interferometry ◽  
Moire Interferometry ◽  
Material System ◽  
Interlaminar Stresses ◽  
Free Edges

As two dissimilar materials are bonded or cocured at elevated temperatures, residual stresses result upon cooling the layered material system to room temperature. It is well known that the free edges of composite laminates experience interlaminar stresses during applied mechanical or thermal loading. These stresses are significant and must be understood. Current experimental methods are not capable of determining the residual stresses along free edges where failure is likely to initiate. This paper describes the initial findings of a novel experimental technique that uses moire´ interferometry and material removal to determine the residual stress distribution resulting from elevated temperature processing at the free edges of layered materials.  

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