Measurements of Deflection and Residual Stress in Thin Films Utilizing Coherent Light Reflection/Projection Moiré Interferometry
Keyword(s):
Keyword(s):
Keyword(s):
1996 ◽
pp. 472-477
1999 ◽
Vol 122
(2)
◽
pp. 215-220
◽
2001 ◽
Vol 329
(8)
◽
pp. 585-593
◽
Keyword(s):
Keyword(s):
2006 ◽
Vol 44
(1)
◽
pp. 68-79
◽
Keyword(s):
2015 ◽
Vol 782
◽
pp. 335-340