Effect of Loading History of Aluminum on Fringe Pattern in Electronic Speckle Pattern Interferometry

Author(s):  
Hiroyuki Suzuki ◽  
Tomohiro Sasaki ◽  
Takehiko Watanabe ◽  
Sanichiro Yoshida
1994 ◽  
Vol 29 (4) ◽  
pp. 257-262 ◽  
Author(s):  
A J Moore ◽  
J R Tyrer

Electronic speckle pattern interferometry has been used to calculate KI and J for compact tension specimens. Automated fringe pattern analysis enables the full field of data to be used with the minimum of operator intervention. Measurements are shown to be accurate to within 10 per cent. The J-measurement procedure employed could form the basis of an automatic fault detection system.


2011 ◽  
Vol 403-408 ◽  
pp. 3195-3198 ◽  
Author(s):  
Yong Hong Wang ◽  
Hua Long Zhou ◽  
Nan Li ◽  
Lian Xiang Yang

The Electronic Speckle Pattern Interferometry (ESPI) is a widely used technique for measurement displacement and deformation. But the fringe phase pattern of ESPI always comes with large noise when using phase-shifting technique. In order to ensure the accuracy of the measurement, it is very important to eliminate the noise of the phase fringe pattern. This paper introduced a phase filtering method, comparing with traditional methods, which can be found is a simple and effective method, and the experimental results have shown that the method was feasible used for image processing of ESPI fringes.


2012 ◽  
Vol 31 (2) ◽  
pp. 268-274 ◽  
Author(s):  
Michael T. Hirschmann ◽  
Stephan Schön ◽  
Faik K. Afifi ◽  
Felix Amsler ◽  
Helmut Rasch ◽  
...  

2000 ◽  
Vol 14 (5) ◽  
pp. 477-482 ◽  
Author(s):  
Koung Suk Kim ◽  
Wan Shik Jang ◽  
Myung Seak Hong ◽  
Ki Soo Kang ◽  
Hyun Chul Jung ◽  
...  

2003 ◽  
Vol 69 (1-2) ◽  
pp. 129-143 ◽  
Author(s):  
A.C. Ruiz-Fernández ◽  
F. Páez-Osuna ◽  
M. Soto-Jiménez ◽  
C. Hillaire-Marcel ◽  
B. Ghaleb

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