Measurement of Quantum Phase Distribution by Projection Synthesis

Author(s):  
David T. Pegg ◽  
Stephen M. Barnett
1995 ◽  
Vol 60 (2-3) ◽  
pp. 275-277 ◽  
Author(s):  
Z. Bialynicka-Birula ◽  
I. Bialynicki-Birula

2002 ◽  
Vol 49 (7) ◽  
pp. 1135-1145 ◽  
Author(s):  
K. L. Pregnell ◽  
D. T. Pegg

1998 ◽  
Vol 57 (2) ◽  
pp. 1451-1453 ◽  
Author(s):  
Ziad H. Musslimani ◽  
Y. Ben-Aryeh

1997 ◽  
Vol 44 (11-12) ◽  
pp. 2135-2148 ◽  
Author(s):  
David T. Pegg ◽  
Stephen M. Barnett ◽  
Lee S. Phillips

Author(s):  
Gunnar Björk ◽  
Alexei Trifonov ◽  
Tedros Tsegaye ◽  
Jonas Söderholm

1997 ◽  
Vol 133 (1-6) ◽  
pp. 153-158 ◽  
Author(s):  
J.R Torgerson ◽  
L Mandel

Author(s):  
S. Hasegawa ◽  
T. Kawasaki ◽  
J. Endo ◽  
M. Futamoto ◽  
A. Tonomura

Interference electron microscopy enables us to record the phase distribution of an electron wave on a hologram. The distribution is visualized as a fringe pattern in a micrograph by optical reconstruction. The phase is affected by electromagnetic potentials; scalar and vector potentials. Therefore, the electric and magnetic field can be reduced from the recorded phase. This study analyzes a leakage magnetic field from CoCr perpendicular magnetic recording media. Since one contour fringe interval corresponds to a magnetic flux of Φo(=h/e=4x10-15Wb), we can quantitatively measure the field by counting the number of finges. Moreover, by using phase-difference amplification techniques, the sensitivity for magnetic field detection can be improved by a factor of 30, which allows the drawing of a Φo/30 fringe. This sensitivity, however, is insufficient for quantitative analysis of very weak magnetic fields such as high-density magnetic recordings. For this reason we have adopted “fringe scanning interferometry” using digital image processing techniques at the optical reconstruction stage. This method enables us to obtain subfringe information recorded in the interference pattern.


Author(s):  
T. Hirayama ◽  
Q. Ru ◽  
T. Tanji ◽  
A. Tonomura

The observation of small magnetic materials is one of the most important applications of electron holography to material science, because interferometry by means of electron holography can directly visualize magnetic flux lines in a very small area. To observe magnetic structures by transmission electron microscopy it is important to control the magnetic field applied to the specimen in order to prevent it from changing its magnetic state. The easiest method is tuming off the objective lens current and focusing with the first intermediate lens. The other method is using a low magnetic-field lens, where the specimen is set above the lens gap.Figure 1 shows an interference micrograph of an isolated particle of barium ferrite on a thin carbon film observed from approximately [111]. A hologram of this particle was recorded by the transmission electron microscope, Hitachi HF-2000, equipped with an electron biprism. The phase distribution of the object electron wave was reconstructed digitally by the Fourier transform method and converted to the interference micrograph Fig 1.


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