Advances in Piezoresistive Cantilevers for Atomic Force Microscopy

1997 ◽  
pp. 147-153 ◽  
Author(s):  
M. Tortonese
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Piezoresistive Cantilevers

Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode

2018 ◽  
Vol 184 ◽  
pp. 199-208 ◽  
Author(s):  
P. Biczysko ◽  
A. Dzierka ◽  
G. Jóźwiak ◽  
M. Rudek ◽  
T. Gotszalk ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Load Force ◽  
Force Microscopy ◽  
Force Modulation ◽  
Atomic Force ◽  
Modulation Mode ◽  
Piezoresistive Cantilevers

Atomic-Force Microscopy with piezoresistive cantilevers

1994 ◽  
Vol 52 ◽  
pp. 1064-1065
Author(s):  
M. Tortonese ◽  
F. J. Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Tunneling ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Cantilever Deflection ◽  
Force Microscopy ◽  
Large Samples ◽  
Atomic Force ◽  
High Lateral Resolution ◽  
Piezoresistive Cantilevers

The atomic force microscope (AFM) works by measuring the deflection of a cantilever as it is scanned over a sample. A sharp tip at the end of the cantilever is responsible for the high lateral resolution achieved with the AFM. There are several ways to measure the deflection of the cantilever. The technique used to measure the deflection of the cantilever most often dictates the mechanical complexity and stability of the instrument. Electron tunneling, interferometry and capacitive sensors have been used successfully. The most common way to measure the cantilever deflection is by means of an optical deflection detector.The piezoresistivc cantilever offers a new way to measure the deflection of the cantilever, with performances comparable to the performances of other deflection detectors, and with the advantage that the sensor is incorporated in the cantilever. This simplifies the design and operation of the microscope In particular, the piezoresistive cantilever facilitates the use and often improves the performances of an AFM when operated in ultra high vacuum (UHV), at low temperature, or when used to image large samples.

Nano-structural signs of the cortical bone fragility: atomic force microscopy study in the femoral neck of elderly hip fracture patients and healthy aged controls

2013 ◽  
Author(s):  
Petar Milovanovic ◽  
Zlatko Rakocevic ◽  
Jelena Potocnik ◽  
Danijela Djonic ◽  
Vladimir Zivkovic ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Hip Fracture ◽  
Femoral Neck ◽  
Cortical Bone ◽  
Microscopy Study ◽  
Bone Fragility ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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