Multi-TSV (Through Silicon Via) Error Detection Using the Non-contact Probing Method

Applied Computing and Information Technology - Studies in Computational Intelligence ◽

10.1007/978-3-030-25217-5_4 ◽

2019 ◽

pp. 47-56

Author(s):

Sang-Min Han ◽

Youngkyu Kim ◽

Jin-Ho Ahn

Keyword(s):

Error Detection ◽

Through Silicon Via

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Prevention or Cure? Error Detection and Correction in Skilled Typists

PsycEXTRA Dataset ◽

10.1037/e502412013-119 ◽

2012 ◽

Author(s):

Gordon D. Logan ◽

Matthew J. C. Crump

Keyword(s):

Error Detection ◽

Error Detection And Correction

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Hierarchical error detection produces cognitive illusions of authorship in skilled typing

PsycEXTRA Dataset ◽

10.1037/e520592012-020 ◽

2010 ◽

Author(s):

Gordon D. Logan ◽

Matthew J. C. Crump

Keyword(s):

Error Detection ◽

Cognitive Illusions

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Concurrent error detection in array dividers by alternating input data

IEE Proceedings E Computers and Digital Techniques ◽

10.1049/ip-e.1992.0019 ◽

1992 ◽

Vol 139 (2) ◽

pp. 123 ◽

Author(s):

C.-L. Wey

Keyword(s):

Error Detection ◽

Concurrent Error Detection

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Space—time mapping, latency of data flow and concurrent error detection in systolic arrays

IEE Proceedings E Computers and Digital Techniques ◽

10.1049/ip-e.1993.0004 ◽

1993 ◽

Vol 140 (1) ◽

pp. 33

Author(s):

H.F. Li ◽

C.N. Zhang ◽

R. Jayakumar

Keyword(s):

Error Detection ◽

Data Flow ◽

Systolic Arrays ◽

Concurrent Error Detection

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Design of Multidirectional Parity Code Using Hamming Code Technique for Error Detection and Correction

PARIPEX-INDIAN JOURNAL OF RESEARCH ◽

10.15373/22501991/may2014/27 ◽

2012 ◽

Vol 3 (5) ◽

pp. 79-81

Author(s):

Vishal Badole ◽

◽

Amit Udawat

Keyword(s):

Error Detection ◽

Hamming Code ◽

Code Technique ◽

Error Detection And Correction

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Front End of Line Through Silicon Via (TSV) Integration

10.1557/proc-1112-e03-02 ◽

2008 ◽

Author(s):

Subhash L. Shinde ◽

Todd M. Bauer ◽

Jordan E. Massad ◽

Dale L. Hetherington

Keyword(s):

Through Silicon Via ◽

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A Region-Based Through-Silicon via Repair Method for Clustered Faults

IEICE Transactions on Electronics ◽

10.1587/transele.e100.c.1108 ◽

2017 ◽

Vol E100.C (12) ◽

pp. 1108-1117 ◽

Author(s):

Tianming NI ◽

Huaguo LIANG ◽

Mu NIE ◽

Xiumin XU ◽

Aibin YAN ◽

...

Keyword(s):

Through Silicon Via ◽

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AUTOMATIC-CONTROLLED INFORMATION PROCESSING AND ERROR DETECTION IN A SIMULATED PHARMACY-VERIFICATION TASK

Perceptual and Motor Skills ◽

10.2466/pms.97.5.151-174 ◽

2003 ◽

Vol 97 (5) ◽

pp. 151

Author(s):

SEAN REILLEY

Keyword(s):

Information Processing ◽

Error Detection ◽

Verification Task

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A method for unsupervised broad-coverage lexical error detection and correction

Proceedings of the Fourth Workshop on Innovative Use of NLP for Building Educational Applications - EdAppsNLP '09 ◽

10.3115/1609843.1609851 ◽

2009 ◽

Author(s):

Nai-Lung Tsao ◽

David Wible

Keyword(s):

Error Detection ◽

Error Detection And Correction

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3D system-on-a-chip design with through-silicon-via-less power supply using highly doped silicon via

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/ab7699 ◽

2020 ◽

Vol 59 (SG) ◽

pp. SGGL04

Author(s):

Kota Shiba ◽

Mototsugu Hamada ◽

Tadahiro Kuroda

Keyword(s):

Power Supply ◽

Chip Design ◽

Through Silicon Via ◽

Doped Silicon ◽

System On A Chip

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