Testing for Long Memory Using Penalized Splines and Adaptive Neyman Methods

Author(s):  
Linyuan Li ◽  
Kewei Lu
1984 ◽  
Vol 29 (7) ◽  
pp. 576-577
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Leonard D. Stern
Keyword(s):  

Bernoulli ◽  
2020 ◽  
Vol 26 (2) ◽  
pp. 1473-1503 ◽  
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Shuyang Bai ◽  
Murad S. Taqqu

2005 ◽  
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pp. 21-45 ◽  
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Andrea Beltratti ◽  
Claudio Morana
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At Risk ◽  

2008 ◽  
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Giulio Nicoletti
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2006 ◽  
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Niels Haldrup ◽  
Morten Ørregaard Nielsen

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