A Multiple-Fault Injection Attack by Adaptive Timing Control Under Black-Box Conditions and a Countermeasure

2014 ◽  
pp. 214-228 ◽  
Author(s):  
Sho Endo ◽  
Naofumi Homma ◽  
Yu-ichi Hayashi ◽  
Junko Takahashi ◽  
Hitoshi Fuji ◽  
...  
Keyword(s):  
Fault Injection ◽  
Black Box ◽  
Timing Control ◽  
Multiple Fault ◽  
Fault Injection Attack ◽  
Adaptive Timing

An Adaptive Multiple-Fault Injection Attack on Microcontrollers and a Countermeasure

2015 ◽  
Vol E98.A (1) ◽  
pp. 171-181
Author(s):  
Sho ENDO ◽  
Naofumi HOMMA ◽  
Yu-ichi HAYASHI ◽  
Junko TAKAHASHI ◽  
Hitoshi FUJI ◽  
...  
Keyword(s):  
Fault Injection ◽  
Multiple Fault ◽  
Fault Injection Attack

scholarly journals Countermeasures Optimization in Multiple Fault-Injection Context

2020 ◽  
Author(s):  
Etienne Boespflug ◽  
Cristian Ene ◽  
Laurent Mounier ◽  
Marie-Laure Potet
Keyword(s):  
Fault Injection ◽  
Multiple Fault

Physical security of deep learning on edge devices: Comprehensive evaluation of fault injection attack vectors

2021 ◽  
Vol 120 ◽  
pp. 114116
Author(s):  
Xiaolu Hou ◽  
Jakub Breier ◽  
Dirmanto Jap ◽  
Lei Ma ◽  
Shivam Bhasin ◽  
...  
Keyword(s):  
Deep Learning ◽  
Comprehensive Evaluation ◽  
Fault Injection ◽  
Physical Security ◽  
Fault Injection Attack

A Low-Cost Fault Injection Attack Resilient FSM Design

2020 ◽  
Author(s):  
Ziming Wang ◽  
Aijiao Cui ◽  
Gang Qu
Keyword(s):  
Fault Injection ◽  
Low Cost ◽  
Fault Injection Attack

Message-Recovery Laser Fault Injection Attack on the Classic McEliece Cryptosystem

2021 ◽  
pp. 438-467
Author(s):  
Pierre-Louis Cayrel ◽  
Brice Colombier ◽  
Vlad-Florin Drăgoi ◽  
Alexandre Menu ◽  
Lilian Bossuet
Keyword(s):  
Fault Injection ◽  
Mceliece Cryptosystem ◽  
Message Recovery ◽  
Laser Fault Injection ◽  
Fault Injection Attack

scholarly journals A Review on Evaluation and Configuration of Fault Injection Attack Instruments to Design Attack Resistant MCU-Based IoT Applications

Electronics ◽  
2020 ◽  
Vol 9 (7) ◽  
pp. 1153
Author(s):  
Zahra Kazemi ◽  
David Hely ◽  
Mahdi Fazeli ◽  
Vincent Beroulle
Keyword(s):  
Fault Injection ◽  
Low Cost ◽  
Security And Privacy ◽  
Production Cycle ◽  
Fault Attacks ◽  
Primary Means ◽  
Level Of Knowledge ◽  
Iot Devices ◽  
Fault Injection Attack ◽  
Evaluation Platform

The Internet-of-Things (IoT) has gained significant importance in all aspects of daily life, and there are many areas of application for it. Despite the rate of expansion and the development of infrastructure, such systems also bring new concerns and challenges. Security and privacy are at the top of the list and must be carefully considered by designers and manufacturers. Not only do the devices need to be protected against software and network-based attacks, but proper attention must also be paid to recently emerging hardware-based attacks. However, low-cost unit software developers are not always sufficiently aware of existing vulnerabilities due to these kinds of attacks. To tackle the issue, various platforms are proposed to enable rapid and easy evaluation against physical attacks. Fault attacks are the noticeable type of physical attacks, in which the normal and secure behavior of the targeted devices is liable to be jeopardized. Indeed, such attacks can cause serious malfunctions in the underlying applications. Various studies have been conducted in other research works related to the different aspects of fault injection. Two of the primary means of fault attacks are clock and voltage fault injection. These attacks can be performed with a moderate level of knowledge, utilizing low-cost facilities to target IoT systems. In this paper, we explore the main parameters of the clock and voltage fault generators. This can help hardware security specialists to develop an open-source platform and to evaluate their design against such attacks. The principal concepts of both methods are studied for this purpose. Thereafter, we conclude our paper with the need for such an evaluation platform in the design and production cycle of embedded systems and IoT devices.

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