Smart Polymer Surfaces

Author(s):  
Juan Rodríguez-Hernández
Soft Matter ◽  
2010 ◽  
Vol 6 (16) ◽  
pp. 3764 ◽  
Author(s):  
M. Filimon ◽  
I. Kopf ◽  
F. Ballout ◽  
D. A. Schmidt ◽  
E. Bründermann ◽  
...  

2009 ◽  
Author(s):  
Jeffrey T. Koberstein

Author(s):  
Erik Wischerhoff ◽  
Nezha Badi ◽  
André Laschewsky ◽  
Jean-François Lutz

2003 ◽  
Vol 36 (6) ◽  
pp. 1994-1999 ◽  
Author(s):  
Spiros H. Anastasiadis ◽  
Haris Retsos ◽  
Stergios Pispas ◽  
Nikos Hadjichristidis ◽  
Stylianos Neophytides

1998 ◽  
Vol 66 (1-4) ◽  
pp. 229-249 ◽  
Author(s):  
J. T. J. Koberstein ◽  
D. E. D. Duch ◽  
W. Hu ◽  
T. J. Lenk ◽  
R. Bhatia ◽  
...  

2013 ◽  
Vol 5 (19) ◽  
pp. 9295-9304 ◽  
Author(s):  
Qian Yu ◽  
Janghwan Cho ◽  
Phanindhar Shivapooja ◽  
Linnea K. Ista ◽  
Gabriel P. López

Author(s):  
L.H. Bolz ◽  
D.H. Reneker

The attack, on the surface of a polymer, by the atomic, molecular and ionic species that are created in a low pressure electrical discharge in a gas is interesting because: 1) significant interior morphological features may be revealed, 2) dielectric breakdown of polymeric insulation on high voltage power distribution lines involves the attack on the polymer of such species created in a corona discharge, 3) adhesive bonds formed between polymer surfaces subjected to such SDecies are much stronger than bonds between untreated surfaces, 4) the chemical modification of the surface creates a reactive surface to which a thin layer of another polymer may be bonded by glow discharge polymerization.


Author(s):  
Bruno Schueler ◽  
Robert W. Odom

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.


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