Standard Wavelet Transform for Angiography Sequences Decorrelation by the Temporal-Window Method

Author(s):  
Encarnación Moyano-Ávila ◽  
Luis Orozco-Barbosa ◽  
Francisco J. Quiles
2021 ◽  
Vol 2021 ◽  
pp. 1-15
Author(s):  
Ji Wei Luo

The “classical pattern” of stock price formation has long been widely used in the determination of future price trends of stocks, and the identification and analysis of classical price patterns have an important guiding role in investors’ decision-making and trading. The wavelet transform is a useful tool to remove some of the noise of time series because it has the characteristic of multiresolution. In this study, we propose a method for stock price pattern recognition based on the wavelet transform and dynamic time warp (DTW). A pattern recognition method with similar quantified results is developed to obtain accurate pattern recognition results. That is, using the wavelet transform to smooth the original price graph, and then using the DTW algorithm improved in this study to find the graph with the smallest distance from the target graph under the sliding window method, the identification and analysis of the target graph can be realized. In order to improve the recognition rate of the target graph, we preprocessed the raw price sequence using the moving average convergence and divergence (MACD) algorithm based on the control experiments set up in this study. The pattern recognition method used in this study will identify the price patterns of a certain time window as a whole, thus avoiding the problem of how to objectively select the important points that constitute a price pattern and the mathematical definition of different price patterns in the previous traditional methods.


2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
Haiyan Wang ◽  
Feng Zhou ◽  
Chunyang Jiang ◽  
Ling Qin ◽  
Huaiqing Zhang

One of the key issues of the accurate parameters analysis for the piecewise envelope current signal is to position the change point precisely. Discrete wavelet transform (DWT) modulus maxima method can detect change point, but the detection window of DWT will cause suspicious change point. Besides, the amount of calculated data is very large in actual process of envelope current signal. Therefore, in this paper, the envelope is used instead of the original sampling data for DWT so as to reduce the calculation amount. What is more, combined with the sliding dislocation window method, the change point can be located accurately and the pseudo-change point can be eliminated. The simulation results as well as the electric locomotive current and forging machine current examples show that it is feasible to detect the change point precisely through the proposed method, which provides possibilities for real-time online monitoring of change point.


Author(s):  
W. R. Duff ◽  
L. E. Thomas ◽  
R. M. Fisher ◽  
S. V. Radcliffe

Successful retrieval of the television camera and other components from the Surveyor III spacecraft by the Apollo 12 astronauts has provided a unique opportunity to study the effects of a known and relatively extensive exposure to the lunar environment. Microstructural effects including those produced by micro-meteorite impact, radiation damage (by both the solar wind and cosmic rays) and solar heating might be expected in the materials used to fabricate the spacecraft. Samples received were in the form of 1 cm2 of painted unpainted aluminum alloy sheet from the top of the camera visor (JPL Code 933) and the sides (935,936) and bottom (934) of the lower camera shroud. They were prepared for transmission electron microscopy by first hand-grinding with abrasive paper to a thickness of 0.006". The edges were lacquered and the sample electropolished in 10% perchloric methanol using the “window” method, to a thickness of ~0.001". Final thinning was accomplished by polishing 3 mm punched disks in an acetic-phosphoric-nitric acid solution.


Author(s):  
S. M. Zemyan ◽  
D. B. Williams

As has been reported elsewhere, a thin evaporated Cr film can be used to monitor the x-ray peak to background ratio (P/B) in an analytical electron microscope. Presented here are the results of P/B measurements for the Cr Ka line on a Philips EM430 TEM/STEM, with Link Si(Li) and intrinsic Ge (IG) x-ray detectors. The goal of the study was to determine the best conditions for x-ray microanalysis.We used the Fiori P/B definition, in which P/B is the ratio of the total peak integral to the average background in a 10 eV channel beneath the peak. Peak and background integrals were determined by the window method, using a peak window from 5.0 to 5.7 keV about Cr Kα, and background windows from 4.1 to 4.8 keV and 6.3 to 7.0 keV.


Author(s):  
Yuhong Jiang

Abstract. When two dot arrays are briefly presented, separated by a short interval of time, visual short-term memory of the first array is disrupted if the interval between arrays is shorter than 1300-1500 ms ( Brockmole, Wang, & Irwin, 2002 ). Here we investigated whether such a time window was triggered by the necessity to integrate arrays. Using a probe task we removed the need for integration but retained the requirement to represent the images. We found that a long time window was needed for performance to reach asymptote even when integration across images was not required. Furthermore, such window was lengthened if subjects had to remember the locations of the second array, but not if they only conducted a visual search among it. We suggest that a temporal window is required for consolidation of the first array, which is vulnerable to disruption by subsequent images that also need to be memorized.


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