Simulation of Automated Visual Inspection Systems for Specular Surfaces Quality Control

Author(s):

Juan Manuel García-Chamizo ◽

Andrés Fuster-Guilló ◽

Jorge Azorín-López

Keyword(s):

Quality Control ◽

Visual Inspection ◽

Inspection Systems ◽

Specular Surfaces

NextGen Calibration Utility for Tool Setup and Matching in Real-Time Automated Visual Inspection Systems

2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ◽

10.1109/asmc49169.2020.9185401 ◽

2020 ◽

Author(s):

Chris Edwards ◽

Cody L. Morgan ◽

John Rudolph ◽

Danniel Slinker ◽

Debashis Panda

Keyword(s):

Real Time ◽

Visual Inspection ◽

Automated Feature Selection Methodology for Reconfigurable Automated Visual Inspection Systems

2007 IEEE International Conference on Automation Science and Engineering ◽

10.1109/coase.2007.4341784 ◽

2007 ◽

Cited By ~ 2

Author(s):

Hugo C. Garcia ◽

J. Rene Villalobos

Keyword(s):

Feature Selection ◽

Visual Inspection ◽

Inspection Systems ◽

Selection Methodology

Development of a Methodological Framework for the Self Reconfiguration of Automated Visual Inspection Systems

2007 5th IEEE International Conference on Industrial Informatics ◽

10.1109/indin.2007.4384757 ◽

2007 ◽

Cited By ~ 4

Author(s):

Hugo C. Garcia ◽

J. Rene Villalobos

Keyword(s):

Visual Inspection ◽

The Self ◽

Methodological Framework ◽

Automated visual inspection stations for next-generation semiconductor package quality control

10.1117/12.250923 ◽

1996 ◽

Author(s):

Mark R. DeYong ◽

Thomas C. Eskridge ◽

John W. Grace ◽

Jeff E. Newberry ◽

J. H. Jones ◽

...

Keyword(s):

Quality Control ◽

Visual Inspection ◽

Next Generation ◽

Automated Visual Inspection

2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) ◽

On benchmarking non-blind deconvolution algorithms: A sample driven comparison of image de-blurring methods for automated visual inspection systems

10.1109/i2mtc.2013.6555693 ◽

2013 ◽

Author(s):

Dorian Schneider ◽

Tilo van Ekeris ◽

Joschka zur Jacobsmuehlen ◽

Sebastian Gross

Keyword(s):

Visual Inspection ◽

Blind Deconvolution ◽

A feature selection method for Automated Visual Inspection systems

2008 6th IEEE International Conference on Industrial Informatics ◽

10.1109/indin.2008.4618318 ◽

2008 ◽

Author(s):

Hugo C. Garcia ◽

J. Rene Villalobos

Keyword(s):

Feature Selection ◽

Visual Inspection ◽

Feature Selection Method ◽

Selection Method ◽

Putting Automated Visual Inspection Systems To Work On The Factory Floor: What's Missing?

10.1117/12.969936 ◽

1990 ◽

Author(s):

Frederick M. Waltz ◽

Michael A. Snyder ◽

Bruce G. Batchelor

Keyword(s):

Visual Inspection ◽

Inspection Systems ◽

Factory Floor

IEEE 2002 28th Annual Conference of the Industrial Electronics Society IECON 02 IECON-02 ◽

2D automated visual inspection system for the remote quality control of SMD assembly

10.1109/iecon.2002.1185317 ◽

2003 ◽

Cited By ~ 3

Author(s):

A. Gallegos-Hernandez ◽

F.J. Ruiz-Sanchez ◽

J.R. Villalobos-Cano

Keyword(s):

Quality Control ◽

Visual Inspection ◽

Inspection System ◽

Automated Visual Inspection

Comparing Threshold-Selection Methods for Image Segmentation: Application to Defect Detection in Automated Visual Inspection Systems

Lecture Notes in Computer Science - Pattern Recognition ◽

10.1007/978-3-319-39393-3_4 ◽

2016 ◽

pp. 33-43

Author(s):

Rafael López-Leyva ◽

Alfonso Rojas-Domínguez ◽

Juan Pablo Flores-Mendoza ◽

Miguel Ángel Casillas-Araiza ◽

Raúl Santiago-Montero

Keyword(s):

Image Segmentation ◽

Defect Detection ◽

Visual Inspection ◽

Threshold Selection ◽

Selection Methods ◽

Automated Visual Inspection Systems

Expert Systems ◽

10.1016/b978-012443880-4/50065-x ◽

2002 ◽

pp. 771-800

Author(s):

I ANDREADIS

Keyword(s):

Visual Inspection ◽