Spatial Database Quality and the Potential Uncertainty Sources

Author(s):  
Šárka Hošková-Mayerová ◽  
Václav Talhofer ◽  
Alois Hofmann ◽  
Petr Kubíček
2012 ◽  
Vol 13 (6) ◽  
pp. 720-726 ◽  
Author(s):  
Benxian FAN ◽  
Qinghe ZHANG ◽  
Yuanjing JU ◽  
Kunying HAN ◽  
Lan JIANG ◽  
...  

Mathematics ◽  
2021 ◽  
Vol 9 (15) ◽  
pp. 1746
Author(s):  
Iñigo Calderon-Uriszar-Aldaca ◽  
Sergio Perez ◽  
Ravi Sinha ◽  
Maria Camara-Torres ◽  
Sara Villanueva ◽  
...  

Additive manufacturing (AM) of scaffolds enables the fabrication of customized patient-specific implants for tissue regeneration. Scaffold customization does not involve only the macroscale shape of the final implant, but also their microscopic pore geometry and material properties, which are dependent on optimizable topology. A good match between the experimental data of AM scaffolds and the models is obtained when there is just a few millimetres at least in one direction. Here, we describe a methodology to perform finite element modelling on AM scaffolds for bone tissue regeneration with clinically relevant dimensions (i.e., volume > 1 cm3). The simulation used an equivalent cubic eight node finite elements mesh, and the materials properties were derived both empirically and numerically, from bulk material direct testing and simulated tests on scaffolds. The experimental validation was performed using poly(ethylene oxide terephthalate)-poly(butylene terephthalate) (PEOT/PBT) copolymers and 45 wt% nano hydroxyapatite fillers composites. By applying this methodology on three separate scaffold architectures with volumes larger than 1 cm3, the simulations overestimated the scaffold performance, resulting in 150–290% stiffer than average values obtained in the validation tests. The results mismatch highlighted the relevance of the lack of printing accuracy that is characteristic of the additive manufacturing process. Accordingly, a sensitivity analysis was performed on nine detected uncertainty sources, studying their influence. After the definition of acceptable execution tolerances and reliability levels, a design factor was defined to calibrate the methodology under expectable and conservative scenarios.


Author(s):  
Aris V. Skarbeli ◽  
Rubén Eusebio‐Yebra ◽  
Pablo Romojaro ◽  
Francisco Álvarez‐Velarde ◽  
Daniel Cano‐Ott

Nanomaterials ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 820
Author(s):  
François Piquemal ◽  
José Morán-Meza ◽  
Alexandra Delvallée ◽  
Damien Richert ◽  
Khaled Kaja

Reference samples are commonly used for the calibration and quantification of nanoscale electrical measurements of capacitances and dielectric constants in scanning microwave microscopy (SMM) and similar techniques. However, the traceability of these calibration samples is not established. In this work, we present a detailed investigation of most possible error sources that affect the uncertainty of capacitance measurements on the reference calibration samples. We establish a comprehensive uncertainty budget leading to a combined uncertainty of 3% in relative value (uncertainty given at one standard deviation) for capacitances ranging from 0.2 fF to 10 fF. This uncertainty level can be achieved even with the use of unshielded probes. We show that the weights of uncertainty sources vary with the values and dimensions of measured capacitances. Our work offers improvements on the classical calibration methods known in SMM and suggests possible new designs of reference standards for capacitance and dielectric traceable measurements. Experimental measurements are supported by numerical calculations of capacitances to reveal further paths for even higher improvements.


2021 ◽  
Vol 376 ◽  
pp. 113632
Author(s):  
Christian Sabater ◽  
Olivier Le Maître ◽  
Pietro Marco Congedo ◽  
Stefan Görtz

2020 ◽  
Author(s):  
Nikola Kranjčić ◽  
Bojan Đurin ◽  
Dragana Dogančić ◽  
Lucija Plantak

Author(s):  
Xiangfu Meng ◽  
Xiaoyan Zhang ◽  
Jinguang Sun ◽  
Lin Li ◽  
Changzheng Xing ◽  
...  

2013 ◽  
Vol 71 (3) ◽  
pp. 1453-1473 ◽  
Author(s):  
Lucia Simeoni ◽  
Paolo Zatelli ◽  
Claudio Floretta

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