Femtosecond Studies of Nonlinear Optical Processes in Wide-Gap II–VI Semiconductors

1990 ◽  
pp. 192-198
Author(s):  
J. Puls ◽  
F. Henneberger ◽  
W. Rudolph ◽  
D. Lab
Keyword(s):  
Nonlinear Optical ◽  
Wide Gap

Review of Nonlinear Optical Processes in Wide Gap II-VI Compounds

1989 ◽  
pp. 167-181 ◽  
Author(s):  
C. Klingshirn ◽  
M. Kunz ◽  
F. A. Majumder ◽  
D. Oberhauser ◽  
R. Renner ◽  
...  
Keyword(s):  
Nonlinear Optical ◽  
Wide Gap

Nonlinear optical properties of wide-gap II–VI bulk semiconductors and microcrystallites

1990 ◽  
Vol 101 (1-4) ◽  
pp. 632-642 ◽  
Author(s):  
F. Henneberger ◽  
J. Puls ◽  
H. Rossmann ◽  
U. Woggon ◽  
S. Freundt ◽  
...  
Keyword(s):  
Optical Properties ◽  
Nonlinear Optical ◽  
Nonlinear Optical Properties ◽  
Bulk Semiconductors ◽  
Wide Gap

scholarly journals NONLINEAR OPTICAL EFFECTS AT THE FUNDAMENTAL ABSORPTION-EDGE OF WIDE-GAP II-VI SEMICONDUCTORS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-91-C2-96
Author(s):  
F. HENNEBERGER ◽  
J. PULS ◽  
H. ROSSMANN ◽  
M. KRETZSCHMAR ◽  
C. SPIEGELBERG ◽  
...  
Keyword(s):  
Absorption Edge ◽  
Nonlinear Optical ◽  
Fundamental Absorption Edge ◽  
Optical Effects ◽  
Nonlinear Optical Effects ◽  
Wide Gap

PbGa4S7: a wide-gap nonlinear optical material

2015 ◽  
Vol 3 (13) ◽  
pp. 3060-3067 ◽  
Author(s):  
Xiaoshuang Li ◽  
Lei Kang ◽  
Chao Li ◽  
Zheshuai Lin ◽  
Jiyong Yao ◽  
...  
Keyword(s):  
Second Harmonic Generation ◽  
Band Gap ◽  
Harmonic Generation ◽  
Nonlinear Optical ◽  
Second Harmonic ◽  
Optical Material ◽  
Nonlinear Optical Material ◽  
Direct Band Gap ◽  
Direct Band ◽  
Wide Gap

PbGa4S7 possesses a large powder second harmonic generation response and a large direct band gap of 3.08 eV.

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

Dark exciton states and magneto-excitons in wide-gap II-VI quantum wells

1998 ◽  
Vol 184-185 (1-2) ◽  
pp. 787-794 ◽  
Author(s):  
F Henneberger
Keyword(s):  
Quantum Wells ◽  
Wide Gap ◽  
Dark Exciton
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