Optical Constants of Basaltic Glass from 0.0173 to 50 μM

Origin and Evolution of Interplanetary Dust - Astrophysics and Space Science Library ◽

10.1007/978-94-011-3640-2_21 ◽

1991 ◽

pp. 102-104 ◽

Cited By ~ 1

Author(s):

E. T. Arakawa ◽

D. W. Young ◽

J. M. Zhang ◽

P. C. Eklund ◽

B. N. Khare ◽

...

Keyword(s):

Optical Constants ◽

Basaltic Glass

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Optical Constants of Basaltic Glass from 0.0173 To 50 μm

International Astronomical Union Colloquium ◽

10.1017/s0252921100066574 ◽

1991 ◽

Vol 126 ◽

pp. 102-104

Author(s):

E. T. Arakawa ◽

D. W. Young ◽

J. M. Zhang ◽

P. C. Eklund ◽

B. N. Khare ◽

...

Keyword(s):

Wavelength Range ◽

Optical Constants ◽

Basaltic Glass ◽

Extreme Uv

AbstractPollacket al. [Icarus19, 372 (1973)] have reported the optical constants for obsidian, basalt, andesite and basaltic glass over the wavelength range 0.2 to 50 μm, and Lamy [Icarus34, 68 (1978)] reported the optical constants from 0.10 to 0.44 μ for obsidian, basalt, and basaltic glass. We have revised the former measurements for basaltic glass and extended them into the extreme UV to 0.0173 μ.

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Development of 200kV ultrahigh-resolution analytical electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152513 ◽

1989 ◽

Vol 47 ◽

pp. 108-109

Author(s):

T. Kaneyama ◽

M. Naruse ◽

Y. Ishida ◽

M. Kersker

Keyword(s):

Electron Microscope ◽

Optical Constants ◽

Materials Science ◽

Objective Lens ◽

The Finite Element Method ◽

Ultrahigh Resolution ◽

Analytical Electron ◽

Analytical Electron Microscope ◽

Characteristic Features ◽

Better Than

In the field of materials science, the importance of the ultrahigh resolution analytical electron microscope (UHRAEM) is increasing. A new UHRAEM which provides a resolution of better than 0.2 nm and allows analysis of a few nm areas has been developed. [Fig. 1 shows the external view] The followings are some characteristic features of the UHRAEM.Objective lens (OL)Two types of OL polepieces (URP for ±10' specimen tilt and ARP for ±30' tilt) have been developed. The optical constants shown in the table on the next page are figures calculated by the finite element method. However, Cs was experimentally confirmed by two methods (namely, Beam Tilt method and Krivanek method) as 0.45 ∼ 0.50 mm for URP and as 0.9 ∼ 1.0 mm for ARP, respectively. Fig. 2 shows an optical diffractogram obtained from a micrograph of amorphous carbon with URP under the Scherzer defocus condition. It demonstrates a resolution of 0.19 nm and a Cs smaller than 0.5 mm.

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