Numerical Study of the Effects of Surface Micro-roughness on the Optical Constants of Aluminum Determined by Spectroscopic Ellipsometry

2014 ◽  
Author(s):  
Wenjie Zhang ◽  
Jiayue Yang ◽  
Linhua Liu
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Numerical Study

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants

Detection of an ordered-structure fraction in amorphous silicon

2016 ◽  
Vol 49 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Xiao-Dong Wang ◽  
Bo Chen ◽  
Hai-Feng Wang ◽  
Xin Zheng ◽  
Shi-Jie Liu ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Radio Frequency ◽  
Amorphous Silicon ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Ordered Structure ◽  
Radio Frequency Magnetron Sputtering ◽  
Medium Range Order ◽  
Medium Range ◽  
Si Films

Amorphous silicon (a-Si) films were prepared by radio frequency magnetron sputtering. Spectroscopic ellipsometry (SE) was utilized to detect an ordered-structure fraction in a-Si. The SE analysis of a-Si films with different thicknesses (7.0–140.0 nm) demonstrates that no more than 2.81% of medium-range order exists in the samples, and interestingly, there is a thickness dependence of optical constants for a-Si in the range of 1.5–5.0 eV.

Eagle XG® glass: Optical constants from 196 to 1688 nm (0.735–6.33 eV) by spectroscopic ellipsometry

2017 ◽  
Vol 24 (2) ◽  
pp. 026001 ◽  
Author(s):  
Cody V. Cushman ◽  
Brian I. Johnson ◽  
Andrew Martin ◽  
Barry M. Lunt ◽  
Nicholas J. Smith ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants

Optical constants of MOCVD-grown Aurivillius phases in the Bi4Ti3O12–Na0.5Bi0.5TiO3 system measured by spectroscopic ellipsometry

2011 ◽  
Vol 105 (1) ◽  
pp. 81-88 ◽  
Author(s):  
S. Bin Anooz ◽  
J. Schwarzkopf ◽  
P. Petrik ◽  
M. Schmidbauer ◽  
A. Duk ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Aurivillius Phases

Ellipsometric study of the complex optical constants of a CsPbBr3 perovskite thin film

2018 ◽  
Vol 6 (39) ◽  
pp. 10450-10455 ◽  
Author(s):  
Minglin Zhao ◽  
Yujun Shi ◽  
Jun Dai ◽  
Jie Lian
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Interband Transitions ◽  
Hybrid Perovskite ◽  
Ellipsometric Study

Complex optical constants and interband transitions of a hybrid perovskite CsPbBr3 thin film measured by spectroscopic ellipsometry.

Optical constants of SiO2 from 196 to 1688 nm (0.735–6.33 eV) from 20, 40, and 60 nm films of reactively sputtered SiO2 on Eagle XG® glass by spectroscopic ellipsometry

2017 ◽  
Vol 24 (2) ◽  
pp. 026002 ◽  
Author(s):  
Brian I. Johnson ◽  
Cody V. Cushman ◽  
Joseph Rowley ◽  
Barry M. Lunt ◽  
Nicholas J. Smith ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants
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